SST38VF6401 datasheet(33/64 Pages) MICROCHIP

33 / 64 page

DS-20005015B

08/15

64 Mbit (x16) Advanced Multi-Purpose Flash Plus

SST38VF6401 / SST38VF6402 / SST38VF6403 / SST38VF6404

Not Recommended for New Designs

DC Characteristics

Table 20: DC Operating Characteristics VDD = 2.7-3.6V1

1. Typical conditions for the Active Current shown on the front page of the data sheet are average values at 25°C

(room temperature), and VDD = 3V. Not 100% tested.

Symbol Parameter

Limits

Test Conditions

Min

Max

Units

IDD

Power Supply Current

Address input=VILT/VIHT2, VDD=VDD

Max

2. See Figure 27

3. The IDD current listed is typically less than 2mA/MHz, with OE# at VIH. Typical VDD is 3V.

CE#=VIL, OE#=WE#=VIH at f= 5

MHz

Intra-Page Read @5 MHz

2.5

CE#=VIL, OE#=WE#=VIH

Intra-Page Read @40 MHz

CE#=VIL, OE#=WE#=VIH

Program and Erase

CE#=WE#=VIL, OE#=VIH

Program-Write-Buffer-to-

Flash

CE#=WE#=VIL, OE#=VIH

ISB

Standby VDD Current

µA

CE#=VIHC, VDD=VDD Max

IALP

Auto Low Power

µA

CE#=VILC, VDD=VDD Max

All inputs=VSS or VDD, WE#=VIHC

ILI

Input Leakage Current

µA

VIN=GND to VDD, VDD=VDD Max

ILIW

Input Leakage Current

on WP# pin and RST#

µA

WP#=GND to VDD or RST#=GND to

VDD

ILO

Output Leakage Current

µA

VOUT=GND to VDD, VDD=VDD Max

VIL

Input Low Voltage

0.8

VDD=VDD Min

VILC

Input Low Voltage (CMOS)

0.3

VDD=VDD Max

VIH

Input High Voltage

0.7VDD

VVDD=VDD Max

VIHC

Input High Voltage (CMOS)

VDD-0.3

VDD=VDD Max

VOL

Output Low Voltage

0.2

IOL=100 µA, VDD=VDD Min

VOH

Output High Voltage

VDD-0.2

IOH=-100 µA, VDD=VDD Min

T20.0 20005015

Table 21: Capacitance (TA = 25°C, f=1 Mhz, other pins open)

Parameter

Description

Test Condition

Maximum

CI/O1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this

parameter.

I/O Pin Capacitance

VI/O = 0V

12 pF

CIN1

Input Capacitance

VIN = 0V

6 pF

T21.0 20005015

Table 22: Reliability Characteristics

Symbol

Parameter

Minimum Specification

Units

Test Method

NEND1,2

1. This parameter is measured only for initial qualification and after a design or process change that could affect this

parameter.

2. NEND endurance rating is qualified as 100,000 cycles minimum per block.

Endurance

100,000

Cycles

JEDEC Standard A117

TDR1

Data Retention

100

Years

JEDEC Standard A103

ILTH1

Latch Up

100 + IDD

JEDEC Standard 78

T22.0 20005015

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