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MT9072AB bảng dữ liệu(PDF) 104 Page - Zarlink Semiconductor Inc

tên linh kiện MT9072AB
Giải thích chi tiết về linh kiện  Octal T1/E1/J1 Framer
PDF  275 Pages
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nhà sản xuất  ZARLINK [Zarlink Semiconductor Inc]
Trang chủ  http://www.zarlink.com
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MT9072AB bảng dữ liệu(HTML) 104 Page - Zarlink Semiconductor Inc

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MT9072
Data Sheet
104
Zarlink Semiconductor Inc.
16.0
JTAG (Joint Test Action Group) Operation
The MT9072 JTAG (Joint Test Action Group) interface conforms to the Boundary-Scan standard IEEE1149.1-1990.
This standard specifies a design-for-testability technique called Boundary-Scan test (BST). Figure 10 shows the
BST architecture which is made up of the following four basic elements. See Figure 30 for JTAG timing.
1. Test Access Port (TAP)
2. TAP Controller
3. Instruction Register (IR)
4. Test Data Registers (TDR)
Figure 10 - Boundary Scan Test Circuit Block Diagram
16.1
Test Access Port (TAP)
The Test Access Port (TAP) provides access to the many test functions of the MT9072. It consists of four input pins
and one output pin. The following pins are from the TAP.
Test Clock Input (TCK) - TCK provides the clock for the test logic. The TCK signal does not interfere with any
on-chip clocks and thus remains independent. The TCK permits shifting of test data into or out of the
Boundary-Scan register cells concurrently with the operation of the device and without interfering with the on-chip
logic.
Test Mode Select Input (TMS) - The logic signals received at the TMS input are interpreted by the TAP Controller
to control the test operations. The TMS signal is sampled at the rising edge of the TCK pulses. This pin is internally
pulled up to device VDD when it is not driven from an external source.
TDI
TDO
TMS
TCK
TRST
TAP
Instruction Register
Bypass Register
Device ID Register
Test Data Registers
Framer
Input
Pins
Framer
Output
Pins
Framer
Core
Logic
Boundary Scan
Register
TAP
Controller



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