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TLK1201ARCP bảng dữ liệu(PDF) 13 Page - Texas Instruments

tên linh kiện TLK1201ARCP
Giải thích chi tiết về linh kiện  Single Monolithic PLL Design
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TLK1201ARCP bảng dữ liệu(HTML) 13 Page - Texas Instruments

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CL
5 pF
CL
5 pF
50
Ω
50
Ω
LVTTL OUTPUT SWITCHING CHARACTERISTICS
tr
tf
CLOCK
80%
50%
20%
tr
tf
2 V
0.8 V
DATA
1.4 V
TRANSMITTER TIMING REQUIREMENTS
TLK1201ARCP, TLK1201AIRCP
ETHERNET TRANSCEIVERS
SLLS580D – FEBRUARY 2004 – REVISED SEPTEMBER 2007
Figure 8. Transmitter Test Setup
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
tr(RBC)
Clock rise time
0.3
1.5
ns
tf(RBC)
Clock fall time
0.3
1.5
80% to 20% output voltage, C = 5 pF (see
Figure 9)
tr
Data rise time
0.3
1.5
ns
tf
Data fall time
0.3
1.5
TBI normal mode, (see Figure 3), Rω = 125 MHz
2.5
Data setup time (RD0–RD9), Data
tsu(D1)
ns
valid prior to RBC0 rising
TBI normal mode, (see Figure 3), Rω = 61.44 MHz
5
TBI normal mode, (see Figure 3), Rω = 125 MHz
2
Data hold time (RD0–RD9), Data valid
th(D1)
ns
after RBC0 rising
TBI normal mode, (see Figure 3), Rω = 61.44 MHz
4
tsu(D2)
Data setup time (RD0–RD4)
DDR mode, Rω = 125 MHz, (see Figure 4)
2
ns
th(D2)
Data hold time (RD0–RD4)
DDR mode, Rω = 125 MHz, (see Figure 4)
0.8
ns
tsu(D3)
Data setup time (RD0–RD9)
TBI half-rate mode, Rω = 125 MHz, (see Figure 2)
2.5
ns
th(D3)
Data hold time (RD0–RD9)
TBI half-rate mode, Rω = 125 MHz, (see Figure 2)
1.5
ns
Figure 9. TTL Data I/O Valid Levels for AC Measurement
over recommended operating conditions (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
tsu(D4)
Data setup time (TD0–TD9)
1.6
TBI modes
ns
th(D4)
Data hold time (TD0–TD9)
0.8
tsu(D5)
Data setup time (TD0–TD9)
0.7
DDR modes
ns
th(D5)
Data hold time (TD0–TD9)
0.5
tr, tf
TD[0,9] data rise and fall time
See Figure 9
2
ns
Copyright © 2004–2007, Texas Instruments Incorporated
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Product Folder Link(s): TLK1201ARCP TLK1201AIRCP



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