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SN65DP149 bảng dữ liệu(PDF) 9 Page - Texas Instruments

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SN65DP149 bảng dữ liệu(HTML) 9 Page - Texas Instruments

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SN65DP149, SN75DP149
www.ti.com
SLLSEL2C – SEPTEMBER 2015 – REVISED JULY 2016
Product Folder Links: SN65DP149 SN75DP149
Submit Documentation Feedback
Copyright © 2015–2016, Texas Instruments Incorporated
7.6 Differential Input Electrical Characteristics
over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
DR_RX_DATA
Ddata lanes data rate
0.25
3.4
Gbps
DR_RX_CLK
Clock lanes clock rate
25
340
MHz
tRX_DUTY
Input clock duty circle
40%
50%
60%
tCLK_JIT
Input clock jitter tolerance
0.3
Tbit
tDATA_JIT
Input data jitter tolerance
Test the TTP2, see Figure 7
150
ps
TRX_INTRA
Input intra-pair skew tolerance
Test at TTP2 when DR = 1.6-Gbps, see
Figure 7
112
ps
TRX_INTER
Input inter-pair skew tolerance
1.8
ns
EQH(D)
Fixed EQ gain for data lane
IN_D(0,1,2)n/p
EQ_SEL/A0 = H; Fixed EQ gain,
test at 3.4-Gbps
14
dB
EQL(D)
Fixed EQ gain for data lane
IN_D(0,1,2)n/p
EQ_SEL/A0 = L; Fixed EQ gain,
test at 3.4-Gbps
7.5
dB
EQZ(D)
Adaptive EQ gain for data lane
IN_D(0,1,2)n/p
EQ_SEL/A0 = Z; adaptive EQ
2
14
dB
EQ(c)
EQ gain for clock lane IN_CLKn/p
EQ_SEL/A0 = H,L,NC
3
RINT
Input differential termination impedance
80
100
120
Ω
VITERM
Input termination voltage
OE = H
0.7
V
VID_PP
Input differential voltage (peak to peak)
Tested at TTP2, check Figure 7
75
1200
mVPP



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