DSPIC33FJ64GS406 datasheet(369/456 Pages) MICROCHIP

369 / 456 page

 2009-2012 Microchip Technology Inc.

DS70591E-page 369

dsPIC33FJ32GS406/606/608/610 and dsPIC33FJ64GS406/606/608/610

DC26d

122

135

-40°C

3.3V

40 MIPS

See Note 2 and 3, except PWM is

operating at 1/2 speed

(PTCON2 = 0x0001)

DC26a

123

135

+25°C

DC26b

124

135

+85°C

DC26c

125

135

+125°C

DC27d

107

120

-40°C

3.3V

40 MIPS

See Note 2 and 3, except PWM is

operating at 1/4 speed

(PTCON2 = 0x0002)

DC27a

108

120

+25°C

DC27b

109

120

+85°C

DC27c

110

120

+125°C

DC28d

100

-40°C

3.3V

40 MIPS

See Note 2 and 3, except PWM is

operating at 1/8 speed

(PTCON2 = 0x0003)

DC28a

100

+25°C

DC28b

100

+85°C

DC28c

100

+125°C

TABLE 27-5:

DC CHARACTERISTICS: OPERATING CURRENT (IDD) (CONTINUED)

DC CHARACTERISTICS

Standard Operating Conditions: 3.0V to 3.6V

(unless otherwise stated)

Operating temperature

-40°C

 TA  +85°C for Industrial

-40°C

 TA  +125°C for Extended

Parameter

No.

Typical(1)

Max

Units

Conditions

Operating Current (IDD)(2)

Note 1: Data in “Typical” column is at 3.3V, +25°C unless otherwise stated.

2: IDD is primarily a function of the operating voltage and frequency. Other factors, such as I/O pin loading

and switching rate, oscillator type, internal code execution pattern and temperature, also have an impact

on the current consumption. The test conditions for all IDD measurements are as follows:

• Oscillator is configured in EC mode with PLL, OSC1 is driven with external square wave from

rail-to-rail (EC clock overshoot/undershoot < 250 mV required)

• CLKO is configured as an I/O input pin in the Configuration Word

• All I/O pins are configured as inputs and pulled to VSS

•MCLR = VDD, WDT and FSCM are disabled

• CPU, SRAM, program memory and data memory are operational

• No peripheral modules are operating; however, every peripheral is being clocked (all PMDx bits are all ‘0’s)

• CPU executing while(1) statement

• JTAG disabled

3: These parameters are characterized but not tested in manufacturing.

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