DSPIC33FJ64GS406 datasheet(368/456 Pages) MICROCHIP

368 / 456 page

dsPIC33FJ32GS406/606/608/610 and dsPIC33FJ64GS406/606/608/610

DS70591E-page 368

 2009-2012 Microchip Technology Inc.

TABLE 27-5:

DC CHARACTERISTICS: OPERATING CURRENT (IDD)

DC CHARACTERISTICS

Standard Operating Conditions: 3.0V to 3.6V

(unless otherwise stated)

Operating temperature

-40°C

 TA  +85°C for Industrial

-40°C

 TA  +125°C for Extended

Parameter

No.

Typical(1)

Max

Units

Conditions

Operating Current (IDD)(2)

DC20d

-40°C

3.3V

10 MIPS

See Note 2

DC20a

+25°C

DC20b

+85°C

DC20c

+125°C

DC21d

-40°C

3.3V

16 MIPS

See Note 2 and 3

DC21a

+25°C

DC21b

+85°C

DC21c

+125°C

DC22d

-40°C

3.3V

20 MIPS

See Note 2 and 3

DC22a

+25°C

DC22b

+85°C

DC22c

+125°C

DC23d

-40°C

3.3V

30 MIPS

See Note 2 and 3

DC23a

+25°C

DC23b

+85°C

DC23c

+125°C

DC24d

-40°C

3.3V

40 MIPS

See Note 2

DC24a

+25°C

DC24b

+85°C

DC24c

+125°C

DC25d

153

170

-40°C

3.3V

40 MIPS

See Note 2 and 3, except PWM is

operating at maximum speed

(PTCON2 = 0x0000)

DC25a

154

170

+25°C

DC25b

155

170

+85°C

DC25c

156

170

+125°C

Note 1: Data in “Typical” column is at 3.3V, +25°C unless otherwise stated.

2: IDD is primarily a function of the operating voltage and frequency. Other factors, such as I/O pin loading

and switching rate, oscillator type, internal code execution pattern and temperature, also have an impact

on the current consumption. The test conditions for all IDD measurements are as follows:

• Oscillator is configured in EC mode with PLL, OSC1 is driven with external square wave from

rail-to-rail (EC clock overshoot/undershoot < 250 mV required)

• CLKO is configured as an I/O input pin in the Configuration Word

• All I/O pins are configured as inputs and pulled to VSS

•MCLR = VDD, WDT and FSCM are disabled

• CPU, SRAM, program memory and data memory are operational

• No peripheral modules are operating; however, every peripheral is being clocked (all PMDx bits are all ‘0’s)

• CPU executing while(1) statement

• JTAG disabled

3: These parameters are characterized but not tested in manufacturing.

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