UJA1075TWSLASH5V0SLASHWD datasheet(27/53 Pages) NXP

27 / 53 page

UJA1075_2

All information provided in this document is subject to legal disclaimers.

Product data sheet

Rev. 02 — 27 May 2010

27 of 53

NXP Semiconductors

UJA1075

High-speed CAN/LIN core system basis chip

6.10 Interrupt output

Pin INTN is an active-LOW, open-drain interrupt output. It is driven LOW when at least

one interrupt is pending. An interrupt can be cleared by writing 1 to the corresponding bit

in the Int_Status register (Table 7). Clearing bits LWI and CWI in Standby mode only

clears the interrupt status bits and not the pending wake-up. The pending wake-up is

cleared on entering Normal mode and when the corresponding standby control bit

(STBCC or STBCL) is 0.

On devices that contain a watchdog, the Cyclic Interrupt (CI) is enabled when the

watchdog switches to Timeout mode while the SBC is in Standby mode or Normal mode

(provided WDOFF = LOW). A CI is generated if the watchdog overflows in Timeout mode.

The CI is provided to alert the microcontroller when the watchdog overflows in Timeout

mode. The CI will wake up the microcontroller from a

μC standby mode. After polling the

Int_Status register, the microcontroller will be aware that the application is in cyclic wake

up mode. It can then perform some checks on CAN and LIN before returning to the

μC

standby mode.

6.11 Temperature protection

The temperature of the SBC chip is monitored in Normal and Standby modes. If the

temperature is too high, the SBC will go to Overtemp mode, where the RSTN pin is driven

LOW and limp home is activated. In addition, the voltage regulators and the CAN and LIN

transmitters are switched off (see also Section 6.1.6 “Overtemp mode”). When the

temperature falls below the temperature shutdown threshold, the SBC will go to Standby

mode. The temperature shutdown threshold is between 165

°C and 200 °C.

Fig 12. Typical application for cyclic sampling of wake-up signals

UJA1075

WAKE1

WAKE2

BAT

WBIAS

015aaa127

47 k

PDTA144E

sample of

WAKEx

sample of

WAKEx

sample of

WAKEx

GND

biasing of

switches

UJA1075TW/5V0/WD bảng dữ liệu(PDF) 27 Page - NXP Semiconductors

UJA1075TW/5V0/WD bảng dữ liệu(HTML) 27 Page - NXP Semiconductors

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53

bảng dữ liệu tải về

Link URL