ATmega64A datasheet(258/392 Pages) ATMEL

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258

8160C–AVR–07/09

ATmega64A

24.8

Using the JTAG Programming Capabilities

Programming of AVR parts via JTAG is performed via the 4-pin JTAG port, TCK, TMS, TDI, and

TDO. These are the only pins that need to be controlled/observed to perform JTAG program-

ming (in addition to power pins). It is not required to apply 12V externally. The JTAGEN Fuse

must be programmed and the JTD bit in the MCUSR Register must be cleared to enable the

JTAG Test Access Port.

The JTAG programming capability supports:

• Flash Programming and verifying

• EEPROM Programming and verifying

• Fuse Programming and verifying

• Lock bit Programming and verifying

The Lock bit security is exactly as in Parallel Programming mode. If the Lock bits LB1 or LB2 are

programmed, the OCDEN Fuse cannot be programmed unless first doing a Chip Erase. This is a

security feature that ensures no back-door exists for reading out the content of a secured

device.

The details on programming through the JTAG interface and programming specific JTAG

instructions are given in the section “Programming Via the JTAG Interface” on page 314.

24.9

On-chip Debug Related Register in I/O Memory

24.9.1

OCDR – On-chip Debug Register

The OCDR Register provides a communication channel from the running program in the micro-

controller to the debugger. The CPU can transfer a byte to the debugger by writing to this

location. At the same time, an internal flag; I/O Debug Register Dirty – IDRD – is set to indicate

to the debugger that the register has been written. When the CPU reads the OCDR Register the

7 LSB will be from the OCDR Register, while the MSB is the IDRD bit. The debugger clears the

IDRD bit when it has read the information.

In some AVR devices, this register is shared with a standard I/O location. In this case, the OCDR

access to the OCDR Register. In all other cases, the standard I/O location is accessed.

Refer to the debugger documentation for further information on how to use this register.

24.10 Bibliography

For more information about general Boundary-scan, the following literature can be consulted:

• IEEE: IEEE Std 1149.1 - 1990. IEEE Standard Test Access Port and Boundary-scan

Architecture, IEEE, 1993.

• Colin Maunder: The Board Designers Guide to Testable Logic Circuits, Addison –Wesley,

1992.

Bit

654

3210

0x22 (0x42)

MSB/IDRD

LSB

OCDR

Read/Write

R/W

Initial Value

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