SN54ACT8997, SN74ACT8997

SCAN-PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES

SCAN-CONTROLLED IEEE STD 1149.1 (JTAG) TAP CONCATENATORS

SCAS157D – APRIL 1990 – REVISED DECEMBER 1996

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POST OFFICE BOX 655303

SCOPE

™ Family of Testability Products

1149.1-1990 (JTAG) Serial Test Bus

Be Included in a Primary Scan Path

to Count or Initiate Interrupt Signals

Scan-Path Identification

CMOS) 1-

µm Process

Small-Outline (DW) Packages, Ceramic

Chip Carriers (FK), and Standard Plastic

(NT) and Ceramic (JT) 300-mil DIPs

description

The ’ACT8997 are members of the Texas

Instruments

SCOPE

™ testability integrated-

circuit family. This family of components facilitates

testing of complex circuit-board assemblies.

The ’ACT8997 enhance the scan capability of TI’s

SCOPE

™ family by allowing augmentation of a

system’s primary scan path with secondary scan

paths (SSPs), which can be individually selected

by the ’ACT8997 for inclusion in the primary scan

path. These devices also provide buffering of test

signals to reduce the need for external logic.

By loading the proper values into the instruction

register and data registers, the user can select up

to four SSPs to be included in a primary scan path. Any combination of the SSPs can be selected at a time. Any

of the device’s six data registers or the instruction register can be placed in the device’s scan path, i.e., placed

between test data input (TDI) and test data output (TDO) for subsequent shift and scan operations.

All operations of the device except counting are synchronous to the test clock pin (TCK). The 8-bit

programmable up/down counter can be used to count transitions on the device condition input (DCI) pin and

output interrupt signals via the device condition output (DCO) pin. The device can be configured to count on

either the rising or falling edge of DCI.

The test access port (TAP) controller is a finite-state machine compatible with IEEE Standard 1149.1.

The SN54ACT8997 is characterized for operation over the full military temperature range of –55

°C to 125°C.

The SN74ACT8997 is characterized for operation from 0

°C to 70°C.

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DCO

MCO

DTDO1

DTDO2

DTDO3

DTDO4

GND

DTMS1

DTMS2

DTMS3

DTMS4

DTCK

TDO

TMS

DCI

MCI

TRST

ID1

ID2

ID3

ID4

DTDI1

DTDI2

DTDI3

DTDI4

TDI

TCK

SN54ACT8997 ...JT PACKAGE

SN74ACT8997 . . . DW OR NT PACKAGE

(TOP VIEW)

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DTDI3

DTDI4

TDI

TCK

TMS

TDO

DTCK

TRST

MCI

DCI

DCO

MCO

DTDO1

DTDO2

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SN54ACT8997 . . . FK PACKAGE

(TOP VIEW)

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Copyright

© 1996, Texas Instruments Incorporated

PRODUCTION DATA information is current as of publication date.

Products conform to specifications per the terms of Texas Instruments

standard warranty. Production processing does not necessarily include

testing of all parameters.

SCOPE and EPIC are trademarks of Texas Instruments Incorporated.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

On products compliant to MIL-PRF-38535, all parameters are tested

unless otherwise noted. On all other products, production

processing does not necessarily include testing of all parameters.