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STM8AF51XX bảng dữ liệu(PDF) 86 Page - STMicroelectronics

tên linh kiện STM8AF51XX
Giải thích chi tiết về linh kiện  Automotive 8-bit MCU, with up to 128 Kbytes Flash, EEPROM, 10-bit ADC, timers, LIN, CAN, USART, SPI, I2C, 3 V to 5.5 V
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nhà sản xuất  STMICROELECTRONICS [STMicroelectronics]
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Electrical characteristics
STM8AF61xx, STM8AF51xx
86/100
Electromagnetic interference (EMI)
Emission tests conform to the SAE J 1752/3 standard for test software, board layout and pin
loading.
Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the
product is stressed to determine its performance in terms of electrical sensitivity. For more
details, refer to the application note AN1181.
Electrostatic discharge (ESD)
Electrostatic discharges (3 positive then 3 negative pulses separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). This test
conforms to the JESD22-A114A/A115A standard. For more details, refer to the application
note AN1181.
Table 38.
EMS data
Symbol
Parameter
Conditions
Level/class
VFESD
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
VDD = 3.3 V, TA= 25 °C,
fMASTER = 16 MHz (HSI clock),
Conforms to IEC 1000-4-2
3B
VEFTB
Fast transient voltage burst limits to be
applied through 100 pF on VDD and VSS
pins to induce a functional disturbance
VDD= 3.3 V, TA= 25 °C,
fMASTER = 16 MHz (HSI clock),
Conforms to IEC 1000-4-4
4A
Table 39.
EMI data
Symbol
Parameter
Conditions
Unit
General conditions
Monitored
frequency band
Max fCPU
(1)
8
MHz
16
MHz
24
MHz
SEMI
Peak level
VDD = 5 V,
TA = 25 °C,
LQFP80 package
conforming to SAE J
1752/3
0.1 MHz to 30 MHz
15
17
22
dBµV
30 MHz to 130 MHz
18
22
16
130 MHz to 1 GHz
-1
3
5
SAE EMI level
2
2.5
2.5
-
1.
Data based on characterization results, not tested in production.



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