7 Device and Documentation Support

7.1 Documentation Support

7.1.1 Related Documentation

For related documentation, see the following:

• Texas Instruments, Analog Engineers Circuit Cookbook: Amplifiers e-book

• Texas Instruments, Precision Design, Comparator with Hysteresis design guide

• Texas Instruments, Window comparator circuit application note

• Texas Instruments, Reference Design, Window Comparator Reference Design design guide

• Texas Instruments, Comparator with and without hysteresis circuit application note

• Texas Instruments, Inverting comparator with hysteresis circuit application note

• Texas Instruments, Non-Inverting Comparator With Hysteresis Circuit application note

• Texas Instruments, Zero crossing detection using comparator circuit application note

• Texas Instruments, PWM generator circuit application note

• Texas Instruments, How to Implement Comparators for Improving Performance of Rotary Encoder in

Industrial Drive Applications application note

• Texas Instruments, A Quad of Independently Func Comparators application note

7.2 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on

Notifications to register and receive a weekly digest of any product information that has changed. For change

details, review the revision history included in any revised document.

7.3 Support Resources

TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight

from the experts. Search existing answers or ask your own question to get the quick design help you need.

Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do

not necessarily reflect TI's views; see TI's Terms of Use.

7.4 Trademarks

TI E2E™ is a trademark of Texas Instruments.

All trademarks are the property of their respective owners.

7.5 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled

with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may

be more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

7.6 Glossary

TI Glossary

This glossary lists and explains terms, acronyms, and definitions.

8 Revision History

NOTE: Page numbers for previous revisions may differ from page numbers in the current version.

DATE

REVISION

NOTES

May 2024

*

Initial Release

TLV1812-EP, TLV1822-EP

SNOSDJ3 – MAY 2024

www.ti.com

26

Submit Document Feedback

Copyright © 2024 Texas Instruments Incorporated

Product Folder Links: TLV1812-EP TLV1822-EP