STM32WB35CC datasheet(168/193 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32WB55xx STM32WB35xx

168/193

DS11929 Rev 11

USB characteristics

The STM32WB55xx and STM32WB35xx USB interface is fully compliant with the USB

specification version 2.0, and is USB-IF certified (for Full-speed device operation).

JTAG/SWD interface characteristics

Unless otherwise specified, the parameters given in Table 98 and Table 99 are derived from

tests performed under the ambient temperature, fPCLKx frequency and supply voltage

conditions summarized in Table 24: General operating conditions, with the following

configuration:



Capacitive load C = 30 pF



Measurement points are done at CMOS levels: 0.5 ₓ VDD

Table 97. USB electrical characteristics(1)

1. TA = -40 to 125 °C unless otherwise specified.

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VDDUSB

USB transceiver operating voltage

3.0(2)

2. The STM32WB55xx and STM32WB35xx USB functionality is ensured down to 2.7 V, but the full USB

electrical characteristics are degraded in the 2.7 to 3.0 V voltage range.

-3.6

Tcrystal_less

USB crystal-less



operation temperature

--15

RPUI

Embedded USB_DP pull-up value

during idle

900

1250

1600

Ω

RPUR

Embedded USB_DP pull-up value

during reception

1400

2300

3200

ZDRV(3)

3. Guaranteed by design.

Output driver impedance(4)

4. No external termination series resistors are required on USB_DP (D+) and USB_DM (D-); the matching

impedance is already included in the embedded driver.

Driving high and low

Table 98. JTAG characteristics

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

1/tc(TCK)

TCK clock frequency

2.7 < VDD < 3.6 V

MHz

1.65 < VDD < 3.6 V

tisu(TMS)

TMS input setup time

2.5

tih(TMS)

TMS input hold time

tisu(TDI)

TDI input setup time

1.5

tih(TDI)

TDI input hold time

tov(TDO)

TDO output valid time

2.7 < VDD < 3.6 V

13.5

16.5

1.65 < VDD < 3.6 V

13.5

toh(TDO)

TDO output hold time

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