STM32WB35CC datasheet(46/193 Pages) STMICROELECTRONICS

46 / 193 page

Functional overview

STM32WB55xx STM32WB35xx

46/193

DS11929 Rev 11

–

Data pre-processing: left/right alignment and per channel offset compensation

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Built-in oversampling unit for enhanced SNR

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Channel-wise programmable sampling time

–

Three analog watchdog for automatic voltage monitoring, generating interrupts

and trigger for selected timers

–

Hardware assistant to prepare the context of the injected channels to allow fast

context switching

3.14.1

Temperature sensor

The temperature sensor (TS) generates a voltage VTS that varies linearly with temperature.

The temperature sensor is internally connected to the ADC1_IN17 input channel, which is

used to convert the sensor output voltage into a digital value.

To improve the accuracy of the temperature sensor measurement, each device is

individually factory-calibrated by ST. The temperature sensor factory calibration data are

stored in the system memory area, accessible in read-only mode.

3.14.2

Internal voltage reference (VREFINT)

The internal voltage reference (VREFINT) provides a stable (bandgap) voltage output for

the ADC and the comparators. VREFINT is internally connected to the ADC1_IN0 input

channel. The precise voltage of VREFINT is individually measured for each part by ST

during production test and stored in the system memory area. It is accessible in read-only

mode.

Table 11. Temperature sensor calibration values

Calibration value name

Description

Memory address

TS_CAL1

TS ADC raw data acquired at a

temperature of 30 °C (± 5 °C),

VDDA = VREF+ = 3.0 V (± 10 mV)

0x1FFF 75A8 - 0x1FFF 75A9

TS_CAL2

TS ADC raw data acquired at a

temperature of 130 °C (± 5 °C),

VDDA = VREF+ = 3.0 V (± 10 mV)

0x1FFF 75CA - 0x1FFF 75CB

Table 12. Internal voltage reference calibration values

Calibration value name

Description

Memory address

VREFINT

Raw data acquired at a

temperature of 30 °C (± 5 °C),

VDDA = VREF+ = 3.6 V (± 10 mV)

0x1FFF 75AA - 0x1FFF 75AB

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