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EDB8164B4PR-1DITF-R bảng dữ liệu(PDF) 130 Page - Micron Technology

tên linh kiện EDB8164B4PR-1DITF-R
Giải thích chi tiết về linh kiện  216-Ball and 220-Ball, Dual-Channel LPDDR2 SDRAM Features
PDF  152 Pages
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EDB8164B4PR-1DITF-R bảng dữ liệu(HTML) 130 Page - Micron Technology

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These parameters are measured from a specific clock edge to a data signal transition
(DMn or DQm, where: n = 0, 1, 2, or 3; and m = DQ[31:0]), and specified timings must be
met with respect to that clock edge. Therefore, they are not affected by tJIT(per).
tQSH, tQSL
These parameters are affected by duty cycle jitter, represented by tCH(abs)min and
tCL(abs)min. These parameters determine the absolute data valid window at the device
pin. The absolute minimum data valid window at the device pin = min [(tQSH(abs)min
× tCK(avg)min - tDQSQmax - tQHSmax), (tQSL(abs)min × tCK(avg)min - tDQSQmax -
tQHSmax)]. This minimum data valid window must be met at the target frequency re-
gardless of clock jitter.
tRPST
tRPST is affected by duty cycle jitter, represented by tCL(abs). Therefore, tRPST(abs)min
can be specified by tCL(abs)min. tRPST(abs)min = tCL(abs)min - 0.05 = tQSL(abs)min.
Clock Jitter Effects on WRITE Timing Parameters
tDS, tDH
These parameters are measured from a data signal (DMn or DQm, where n = 0, 1, 2, 3;
and m = DQ[31:0]) transition edge to its respective data strobe signal (DQSn_t, DQSn_c:
n = 0,1,2,3) crossing. The specification values are not affected by the amount of tJIT(per)
applied, because the setup and hold times are relative to the clock signal crossing that
latches the command/address. Regardless of clock jitter values, these values must be
met.
tDSS, tDSH
These parameters are measured from a data strobe signal crossing (DQSx_t, DQSx_c) to
its clock signal crossing (CK_t/CK_c). The specification values are not affected by the
amount of tJIT(per)) applied, because the setup and hold times are relative to the clock
signal crossing that latches the command/address. Regardless of clock jitter values,
these values must be met.
tDQSS
tDQSS is measured from the clock signal crossing (CK_t/CK_c) to the first latching data
strobe signal crossing (DQSx_t, DQSx_c). When the device is operated with input clock
jitter, this parameter must be derated by the actual tJIT(per),act of the input clock in ex-
cess of tJIT(per),allowed.
tDQSS(min,derated) = 0.75 -
tJIT(per),act,min – tJIT(per),allowed, min
tCK(avg)
tDQSS(max,derated) = 1.25 –
tJIT(per),act,max – tJIT(per),allowed, max
tCK(avg)
For example, if the measured jitter into an LPDDR2-800 device has tCK(avg) = 2500ps,
tJIT(per),act,min = -172ps, and tJIT(per),act,max = +193ps, then:
tDQSS,(min,derated) = 0.75 - (tJIT(per),act,min - tJIT(per),allowed,min)/tCK(avg) =
0.75 - (-172 + 100)/2500 = 0.7788 tCK(avg), and
tDQSS,(max,derated) = 1.25 - (tJIT(per),act,max - tJIT(per),allowed,max)/tCK(avg) =
1.25 - (193 - 100)/2500 = 1.2128 tCK(avg).
216-Ball and 220-Ball, Dual-Channel LPDDR2 SDRAM
Clock Period Jitter
09005aef85eb530a
216b_220b_2ch_2e0e_embedded_lpddr2.pdf – Rev. F 08 /16 EN
130
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2014 Micron Technology, Inc. All rights reserved.



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