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Table 45. Comparator with 8-bit DAC electrical specifications for S32K14xW series
(continued)
Symbol
Description
Min.
Typ.
Max.
Unit
VHYST1
Analog comparator hysteresis, Hyst1, High-speed
mode
mV
-40 - 125
℃
—
19
66
-40 - 150
℃
—
19
90
Analog comparator hysteresis, Hyst1, Low-speed
mode
-40 - 125
℃
—
15
40
-40 - 150
℃
—
15
40
VHYST2
Analog comparator hysteresis, Hyst2, High-speed
mode
mV
-40 - 125
℃
—
34
133
-40 - 150
℃
—
34
186
Analog comparator hysteresis, Hyst2, Low-speed
mode
-40 - 125
℃
—
23
80
-40 - 150
℃
—
23
80
VHYST3
Analog comparator hysteresis, Hyst3, High-speed
mode
mV
-40 - 125
℃
—
46
200
-40 - 150
℃
—
46
280
Analog comparator hysteresis, Hyst3, Low-speed
mode
-40 - 125
℃
—
32
120
-40 - 150
℃
—
32
120
IDAC8b
8-bit DAC current adder (enabled)
3.3V Reference Voltage
—
6
9
μA
5V Reference Voltage
—
10
16
μA
INL5
8-bit DAC integral non-linearity
LSB6
-40 - 125
℃
–0.75
—
0.75
-40 - 150
℃
-2
—
2
DNL
8-bit DAC differential non-linearity
–0.5
—
0.5
LSB-1
tDDAC
Initialization and switching settling time
—
—
30
μs
1. Difference at input > 200mV
2. Applied ± (100 mV + VHYST0/1/2/3+ max. of VAIO) around switch point.
3. Applied ± (30 mV + 2 × VHYST0/1/2/3+ max. of VAIO) around switch point.
4. Applied ± (100 mV + VHYST0/1/2/3).
5. Calculation method used: Linear Regression Least Square Method
6. 1 LSB = Vreference/256
NOTE
For comparator IN signals adjacent to VDD/VSS or XTAL/
EXTAL or switching pins cross coupling may happen and
ADC electrical specifications
S32K1xx Data Sheet, Rev. 12, 02/2020
62
NXP Semiconductors



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