STM32G071C8 datasheet(80/133 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32G071x8/xB

80/133

DS12232 Rev 3

All I/Os are CMOS- and TTL-compliant (no software configuration required). Their

characteristics cover more than the strict CMOS-technology or TTL parameters, as shown

in Figure 21.

Figure 21. I/O input characteristics

Output driving current

The GPIOs (general purpose input/outputs) can sink or source up to ±6 mA, and up to

±15 mA with relaxed VOL/VOH.

In the user application, the number of I/O pins which can drive current must be limited to

respect the absolute maximum rating specified in Section 5.2:

•

The sum of the currents sourced by all the I/Os on VDDIO1, plus the maximum

consumption of the MCU sourced on VDD, cannot exceed the absolute maximum rating

IVDD (see Table 18: Voltage characteristics).

•

The sum of the currents sunk by all the I/Os on VSS, plus the maximum consumption of

the MCU sunk on VSS, cannot exceed the absolute maximum rating IVSS (see Table 18:

Voltage characteristics).

Output voltage levels

Unless otherwise specified, the parameters given in the table below are derived from tests

performed under the ambient temperature and supply voltage conditions summarized in

4. This value represents the pad leakage of the I/O itself. The total product pad leakage is provided by this formula:

ITotal_Ileak_max = 10 µA + [number of I/Os where VIN is applied on the pad] ₓ Ilkg(Max).

5. Pull-up and pull-down resistors are designed with a true resistance in series with a switchable PMOS/NMOS. This

PMOS/NMOS contribution to the series resistance is minimal (~10% order).

MSv47925V1

1.6

1.8

2.0

2.2

2.4

2.6

2.8

3.0

3.2

3.4

3.6

0.5

1.5

2.5

Minimum required

logic level 1 zone

Minimum required

logic level 0 zone

VIHmin

= 0.7

VDDIO

(CMOS

standard

requirement)

VILmax = 0.3

VDDIO

(CMOS standard

requirement)

Undefined input range

VIHmin =

0.49 VDDIO

+ 0.26

VILmax = 0.39

VDDIO - 0.06

VIN (V)

VDDIO (V)

TTL standard requirement

Device characteristics

Test thresholds

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