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CDCE6214RGET bảng dữ liệu(PDF) 7 Page - Texas Instruments |
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CDCE6214RGET bảng dữ liệu(HTML) 7 Page - Texas Instruments |
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7 / 53 page ![]() 7 CDCE6214 www.ti.com SNAS811 – JULY 2020 Product Folder Links: CDCE6214 Submit Documentation Feedback Copyright © 2020, Texas Instruments Incorporated General-Purpose Input Characteristics (continued) VDD_VCO, VDDO_12, VDDO_34, VDD_REF = 1.8 V ± 5%, 2.5 V ± 5%, 3.3 V ± 5% and TA = -40°C to 105°C PARAMETER TEST CONDITIONS MIN TYP MAX UNIT IIL Input low level current VIL = GND, GPIO[2:3] -5 5 µA IIL Input low level current VIL = GND, GPIO[1], GPIO[4], PDN -100 100 µA dVIN/dT Input slew rate 20% - 80% 0.5 V/ns TPULSE_WIDT H Pulse width for correct operation 10 ns RPU Pullup Resistance Pins PDN, GPIO[1], GPIO[4] 30 55 80 k Ω CIN Pin Capacitance 10 pF 7.10 Triple Level Input Characteristics VDD_VCO, VDDO_12, VDDO_34, VDD_REF = 1.8 V ± 5%, 2.5 V ± 5%, 3.3 V ± 5% and TA = -40°C to 105°C PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIH Input high voltage 0.8 × VDD_REF V VIM Input mid voltage Float pin 0.41 × VDD_REF 0.5 × VDD_REF 0.58 × VDD_REF V VIL Input low voltage 0.2 × VDD_REF V IIH Input high level current VIH = VDD_REF 20 50 100 µA IIL Input low level current VIL = GND -100 -50 -20 µA 7.11 Logic Output Characteristics VDD_VCO, VDDO_12, VDDO_34, VDD_REF = 1.8 V ± 5%, 2.5 V ± 5%, 3.3 V ± 5% and TA = -40°C to 105°C PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VOH Output high voltage 0.8 × VDD_REF V VOL Output low voltage 0.2 × VDD_REF V (1) The maximum allowable temperature drift for continuous lock: how far the temperature can drift in either direction from the value it was at the time, when the On-Chip VCO was calibrated while the PLL stays in lock throughout the temperature drift. The internal VCO calibration takes place: at device start-up, when the device is reset using the RESET pin and when REGISTER bit is changed. This implies the device will work over the entire frequency range, but if the temperature drifts more than the 'maximum allowable temperature drift for continuous lock', then it is necessary to re-calibrate the VCO, using the appropriate REGISTER bit, to ensure the PLL stays in lock. Regardless of what temperature the part was initially calibrated at, the temperature can never drift outside the ambient temperature range of -40° C to 105° C. 7.12 Phase Locked Loop Characteristics VDD_VCO, VDDO_12, VDDO_34, VDD_REF = 1.8 V ± 5%, 2.5 V ± 5%, 3.3 V ± 5% and TA = -40°C to 105°C PARAMETER TEST CONDITIONS MIN TYP MAX UNIT fPFD Phase Detector Frequency Integer and Fractional PLL mode 1 100 MHz fVCO Voltage Controlled Oscillator Frequency 2335 2625 MHz fBW Configurable closed-loop PLL Bandwidth REF = 25 MHz 100 1600 kHz KVCO Voltage-Controlled Oscillator Gain fVCO = 2.4 GHz 140 MHz/V KVCO Voltage-Controlled Oscillator Gain fVCO = 2.5 GHz 175 MHz/V |ΔTCL| Allowable Temperature Drift for Continuous Lock(1) dT/dt ≤ 20 K / min 145 oC fMAX-ERROR Maximum frequency error with frac-N PLL 0.1 ppm 7.13 Closed-Loop Output Jitter Characteristics VDD_VCO, VDDO_12, VDDO_34, VDD_REF = 1.8 V ± 5%, 2.5 V ± 5%, 3.3 V ± 5% and TA = -40°C to 105°C PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tRJ_CL RMS Phase Jitter RMS jitter with spurs from 12 kHz to 20 MHz , Input Crystal = 25 MHz, Differential OUTx > 100 MHz, int-PLL 350 600 fs |
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