IC-GD datasheet(22/55 Pages) ICHAUS

22 / 55 page

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iC-GD

UNIVERSAL I/O INTERFACE

Rev A1, Page 22/55

Diagnostic measurements

Name

Conversion

Measurement range

+15 V supply voltage VB

5.25 V

214

DIAG · 6

0...18 V

-15 V supply voltage VNB

5.25 V

214

DIAG · 6 − 26.25 V -18...-8.25 V

3.3...5 V supply voltage VCC

5.25 V

214

DIAG · 2

0...6 V

24 V supply voltage VDA

5.25 V

214

DIAG · 12

0...36 V

5.25 V supply voltage analog VPA

5.25 V

214

DIAG · 2

0...6 V

5.25 V supply voltage digital VPD

5.25 V

214

DIAG · 2

0...6 V

Current from digital hi-side output IAx

−

60 µA

214

DIAG · 10000

-600...0 mA

Current into digital lo-side output IAx

60 µA

214

DIAG · 10000

0...600 mA

Table 12: Diagnostic measurements

EEPROM

Batch number and one-time programming

During production, a 24-bit serial number is stored on

the chip. It is composed of the batch, wafer and chip

number and can be read via SPI. In addition, the tem-

perature coefficient of the bandgap (ATK), the tempera-

ture coefficient of the chip’s internal resistor for current

measurement (AITKQ, AITKL) and the offset of the chip

temperature measurement (AOCT) are calculated and

stored (OTP).

EEPROM

The following table describes the structure of the data

in the EEPROM starting at the top left with address

0x00. Every cell represents one byte.

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