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SPC560P34L1 bảng dữ liệu(PDF) 53 Page - STMicroelectronics

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SPC560P34L1, SPC560P34L3, SPC560P40L1, SPC560P40L3
Electrical characteristics
Doc ID 16100 Rev 7
53/103
Equation 2: RθJA = RθJC + RθCA
where:
RθJA = junction-to-ambient thermal resistance (°C/W)
RθJC = junction-to-case thermal resistance (°C/W)
RθCA = case-to-ambient thermal resistance (°C/W)
RθJC is device related and cannot be influenced by the user. The user controls the thermal
environment to change the case-to-ambient thermal resistance, RθCA. For instance, the
user can change the size of the heat sink, the air flow around the device, the interface
material, the mounting arrangement on printed circuit board, or change the thermal
dissipation on the printed circuit board surrounding the device.
To determine the junction temperature of the device in the application when heat sinks are
not used, the Thermal Characterization Parameter (
ΨJT) can be used to determine the
junction temperature with a measurement of the temperature at the top center of the
package case using Equation 3:
Equation 3: TJ = TT + (ΨJT x PD)
where:
TT = thermocouple temperature on top of the package (°C)
ΨJT = thermal characterization parameter (°C/W)
PD = power dissipation in the package (W)
The thermal characterization parameter is measured per JESD51-2 specification using a 40
gauge type T thermocouple epoxied to the top center of the package case. The
thermocouple should be positioned so that the thermocouple junction rests on the package.
A small amount of epoxy is placed over the thermocouple junction and over about 1 mm of
wire extending from the junction. The thermocouple wire is placed flat against the package
case to avoid measurement errors caused by cooling effects of the thermocouple wire.
References:
Semiconductor Equipment and Materials International
3081 Zanker Road
San Jose, CA 95134U.S.A.
(408) 943-6900
MIL-SPEC and EIA/JESD (JEDEC) specifications are available from Global
Engineering Documents at (800) 854-7179 or (303) 397-7956.
JEDEC specifications are available on the WEB at http://www.jedec.org.
C.E. Triplett and B. Joiner, An Experimental Characterization of a 272 PBGA Within an
Automotive Engine Controller Module, Proceedings of SemiTherm, San Diego, 1998,
pp. 47–54.
G. Kromann, S. Shidore, and S. Addison, Thermal Modeling of a PBGA for Air-Cooled
Applications, Electronic Packaging and Production, pp. 53–58, March 1998.
B. Joiner and V. Adams, Measurement and Simulation of Junction to Board Thermal
Resistance and Its Application in Thermal Modeling, Proceedings of SemiTherm, San
Diego, 1999, pp. 212–220.



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