LQFP100 datasheet(72/116 Pages) STMICROELECTRONICS

72 / 116 page

Package pinouts and signal descriptions

SPC560B40x/50x, SPC560C40x/50x

72/116

DocID14619 Rev 13

3.20.3.2

Static latch-up (LU)

Two complementary static tests are required on six parts to assess the latch-up

performance:



A supply overvoltage is applied to each power supply pin.



A current injection is applied to each input, output and configurable I/O pin.

These tests are compliant with the EIA/JESD 78 IC latch-up standard.

3.21

Fast external crystal oscillator (4 to 16 MHz) electrical

characteristics

The device provides an oscillator/resonator driver. Figure 13 describes a simple model of

the internal oscillator driver and provides an example of a connection for an oscillator or a

resonator.

Table 37 provides the parameter description of 4 MHz to 16 MHz crystals used for the

design simulations.

A device will be defined as a failure if after exposure to ESD pulses the device no longer meets the device specification

requirements. Complete DC parametric and functional testing shall be performed per applicable device specification at

room temperature followed by hot temperature, unless specified otherwise in the device specification.

Table 36. Latch-up results

Symbol

Parameter

Conditions

Class

T Static latch-up class

TA = 125 °C

conforming to JESD 78

II level A

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