QT20.361

Q-Series

Oct. 2006 / Rev. 1.0 DS-QT20.361-EN

All parameters are specified at 36V, 13.3A, 3x400Vac, 25°C ambient and after a 5 minutes run-in time unless otherwise noted.

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Germany

Type

Bi-stable, quick-connect spring clamp terminals. IP20 Finger safe construction.

Suitable for field- and factory installation. Shipped in open position.

Solid wire

0.5-6mm

2

Stranded wire

0.5-4mm

2

American wire gauge

20-10 AWG

Ferrules

Allowed, but not required

Wire stripping length

10mm / 0.4inch

Pull-out force

10AWG:80N, 12AWG:60N, 14AWG:50N, 16AWG:40N (according to UL486E)

Fig. 14-1 Connecting a wire

1. Insert the wire

2. Snap the lever

To disconnect wire: same procedure

vice versa

Instructions:

a)

Use appropriate copper cables that are designed

for an operating temperature of:

60°C for ambient up to 45°C and

75°C for ambient up to 60°C minimum.

b)

Follow national installation codes and

installation regulations!

c)

Ensure that all strands of a stranded wire enter

the terminal connection!

d)

Up to two stranded wires with the same cross

section are permitted in one connection point

(except PE wire).

e)

Do not use the unit without PE connection.

3AC 400V

3AC 480V

Lifetime expectancy

min.

51 000h

48 000h

40°C, 36V, 13.3A

min.

89 000h

86 000h

40°C, 36V, 6.7A

min.

144 000h

135 000h

25°C, 36V, 13.3A

MTBF SN 29500, IEC 61709

690 000h

670 000h

40°C, 36V, 13.3A

1 194 000h

1 159 000h

25°C, 36V, 13.3A

MTBF MIL HDBK 217F

284 000h

271 000h

40°C, 36V, 13.3A, Ground Benign GB40

389 000h

371 000h

25°C, 36V, 13.3A, Ground Benign GB25

The Lifetime expectancy shown in the table indicates the operating hours (service life) and is determined by the

lifetime expectancy of the built-in electrolytic capacitors.

Lifetime expectancy is specified in operational hours. Lifetime expectancy is calculated according to the capacitor’s

manufacturer specification. The prediction model allows a calculation of up to 15 years from date of shipment.

MTBF stands for Mean Time Between Failure, which is calculated according to statistical device failures, and indicates

reliability of a device. It is the statistical representation of the likelihood of a unit to fail and does not necessarily

represent the life of a product.

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