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TMS570LS1114 bảng dữ liệu(PDF) 20 Page - Texas Instruments

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tên linh kiện TMS570LS1114
Giải thích chi tiết về linh kiện  16- and 32-Bit RISC Flash Microcontroller
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TMS570LS1114 bảng dữ liệu(HTML) 20 Page - Texas Instruments

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TMS570LS1114
SPNS188B – OCTOBER 2012 – REVISED FEBRUARY 2015
www.ti.com
4.3.1.15 Test and Debug Modules Interface
Table 4-15. PGE Test and Debug Modules Interface
Terminal
Signal
Reset Pull
Pull Type
Description
Type
State
Signal Name
144
PGE
TEST
34
Input
Pull Down
Fixed 100 µA
Test enable. This terminal
Pull Down
must be connected to
ground directly or via a
pull-down resistor.
nTRST
109
Input
JTAG test hardware reset
RTCK
113
Output
N/A
None
JTAG return test clock
TCK
112
Input
Pull Down
Fixed 100 µA
JTAG test clock
Pull Down
TDI
110
Input
Pull Up
Fixed 100 µA
JTAG test data in
Pull Up
TDO
111
Output
100 µA
None
JTAG test data out
Pull Down
TMS
108
Input
Pull Up
Fixed 100 µA
JTAG test select
Pull Up
4.3.1.16 Flash Supply and Test Pads
Table 4-16. PGE Flash Supply and Test Pads
Terminal
Signal
Reset Pull
Pull Type
Description
Type
State
Signal Name
144
PGE
VCCP
134
3.3V
N/A
None
Flash pump supply
Power
FLTP1
7
-
N/A-
None
Flash test pads. These
terminals are reserved for
FLTP2
8
TI use only. For proper
operation these terminals
must connect only to a
test pad or not be
connected at all [no
connect (NC)].
20
Terminal Configuration and Functions
Copyright © 2012–2015, Texas Instruments Incorporated
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