OBSOLETE

LM2575EP, LM2575HVEP

SNVS301B – DECEMBER 2004 – REVISED APRIL 2013

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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam

during storage or handling to prevent electrostatic damage to the MOS gates.

ABSOLUTE MAXIMUM RATINGS

(1) (2)

Maximum Supply Voltage

LM2575EP

45V

LM2575HVEP

63V

ON /OFF Pin Input Voltage

Output Voltage to Ground (Steady State)

−1V

Power Dissipation

Internally Limited

Storage Temperature Range

−65°C to +150°C

Maximum Junction Temperature

150°C

Minimum ESD Rating (C = 100 pF, R = 1.5 k

Ω)

2 kV

Lead Temperature (Soldering, 10 sec.)

260°C

(1)

Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for

which the device is intended to be functional, but do not ensure specific performance limits. For ensured specifications and test

conditions, see the Electrical Characteristics.

(2)

If Military/Aerospace specified devices are required, please contact the Texas Instruments Sales Office/ Distributors for availability and

specifications.

OPERATING RATINGS

Temperature Range

LM2575EP/LM2575HVEP

Supply Voltage

LM2575EP

40V

LM2575HVEP

60V

LM2575-3.3EP, LM2575HV-3.3EP

ELECTRICAL CHARACTERISTICS

(1)

Temperature Range .

LM2575-3.3EP

Units

LM2575HV-3.3EP

Symbol

Parameter

Conditions

Typ

(Limits)

Output Voltage

3.3

V

Circuit of Figure 25

3.234

V(Min)

3.366

V(Max)

Output Voltage

4.75V

3.3

V

LM2575EP

Circuit of Figure 25

3.168/3.135

V(Min)

3.432/3.465

V(Max)

Output Voltage

4.75V

3.3

V

LM2575HVEP

Circuit of Figure 25

3.168/3.135

V(Min)

3.450/3.482

V(Max)

η

Efficiency

75

%

(1)

"Testing and other quality control techniques are used to the extent deemed necessary to ensure product performance over the

specified temperature range. Product may not necessarily be tested across the full temperature range and all parameters may not

necessarily be tested. In the absence of specific PARAMETRIC testing, product performance is assured by characterization and/or

design."

(2)

All limits ensured at room temperature (standard type face) and at temperature extremes (bold type face). All room temperature limits

are 100% production tested. All limits at temperature extremes are specified via correlation using standard Statistical Quality Control

(SQC) methods.

(3)

External components such as the catch diode, inductor, input and output capacitors can affect switching regulator system performance.

When the LM2575EP is used as shown in the Figure 25 test circuit, system performance will be as shown in system parameters section

of Electrical Characteristics.

4

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