PALCE20V8 Family

21

ENDURANCE CHARACTERISTICS

The PALCE20V8 is manufactured using Vantis’ advanced electrically-erasable (EE) CMOS process.

This technology uses an EE cell to replace the fuse link used in bipolar parts. As a result, the

device can be erased and reprogrammed—a feature which allows 100% testing at the factory.

ROBUSTNESS FEATURES

The PALCE20V8X-X/5 have some unique features that make them extremely robust, especially

when operating in high-speed design environments. Pull-up resistors on inputs and I/O pins

cause unconnected pins to default to a known state. Input clamping circuitry limits negative

overshoot, eliminating the possibility of false clocking caused by subsequent ringing. A special

noise filter makes the programming circuitry completely insensitive to any positive overshoot

that has a pulse width of less than about 100 ns for the /5 versions.

Symbol

Parameter

Test Conditions

Value

Unit

Min Pattern Data Retention Time

Max Storage Temperature

10

Years

Max Operating Temperature

20

Years

N

Max Reprogramming Cycles

Normal Programming Conditions

100

Cycles