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AN3161 bảng dữ liệu(PDF) 12 Page - STMicroelectronics |
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AN3161 bảng dữ liệu(HTML) 12 Page - STMicroelectronics |
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12 / 14 page ![]() Conclusion AN3161 12/14 Doc ID 17151 Rev 1 5 Conclusion Several tests performed on the new advanced planar PT STGW35HF60WD show that STMicroelectronics’ advanced PT technology can be paralleled with satisfactory performance in terms of thermal and current sharing. Reliable paralleling, however, requires good thermal feedback implementation and VCE(sat) selection of the total IGBT population. Both of these factors provide a balancing mechanism to reduce and keep stable the dynamic ∆IC at operating conditions. Finally, the STGW35HF60WD is offered in three different VCE(sat) groups, as shown in Table 2: Suggested VCE(sat) (@20 A, 25 °C, 15 V) selection as per datasheet and as reported in the datasheet, for a safe parallel connection without risk of thermal runaway. Table 2. Suggested VCE(sat) (@20 A, 25 °C, 15 V) selection as per datasheet (1) 1. The VCE(sat) grouping reported above is slightly different from the one in Figure 6, in order to meet the testing rules. Group “A” Group “B” Group “C” 1.68 V − 1.92 V 1.88 V − 2.17 V 2.13 V − 2.5 V @20 A, 25 °C, 15 V @20 A, 25 °C, 15 V @20 A, 25 °C, 15 V |
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