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AN2208 bảng dữ liệu(PDF) 24 Page - STMicroelectronics

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AN2208 bảng dữ liệu(HTML) 24 Page - STMicroelectronics

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6 Electromagnetic compatibility (EMC) tests
AN2208
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6.3.3
IEC 61000-4-6
●
Test voltage: Level 3 (10 V)
●
Frequency range: 150 kHz to 80MHz
●
Modulation: 80% depth by AM 1 kHz
●
Frequency step: 1%
●
Dwell Time 100 ms
●
Applied to: Input/Output ports and Supply lines
6.4
IEC 61000-4-4 EFT test setup
The reference design boards are tested on input/output ports and power supply lines. The test
voltage is applied from the EFT generator to the EUT via a capacitive coupling clamp. The test
setup and test voltage waveform comply with IEC 61000-4-4 specifications. The capacitive
coupling clamp is connected by a high-voltage coaxial cable to the generator as close as
possible to the EUT.
6.4.1
Power supply tests
Figure 19 illustrates the power supply test setup. A capacitive coupling clamp applies the test
voltage (max. 4 kV) to the power supply lines. A decoupling network (DN) protects the power
supply against the test voltage.
EUT test conditions:
Input port ON/OFF and fOPER = 1 Hz
Input port wave form: Square 0/5V; f = 1 Hz
6.4.2
Input port tests
Figure 21 illustrates the input port test setup. The RDB input ports are tested by first switching
them to ground and then to the 5V supply using the battery-powered switch shown in Figure 20
to increase protection.
Maximum test voltage must not exceed 4 kV.
Figure 19. Power supply tests (IEC 61000-4-4)



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