ZSSC3036

Low-Power 16-Bit Sensor Signal Conditioner IC

Data Sheet

May 28, 2013

© 2013 Zentrum Mikroelektronik Dresden AG

— Rev. 1.20

All rights reserved. The material contained herein may not be reproduced, adapted, merged, translated, stored, or used without

the prior written consent of the copyright owner. The information furnished in this publication is subject to changes without notice.

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Table 2.7

Typical Conversion Times vs. Noise Performance for 16-Bit Results with Full Sensor Signal

Conditioning for AZBM, BM, AZTM, and TM

Note:

The pink shading indicates ZMDI’s recommended ADC segmentation for temperature sensor measurement.

ADC Segmentation:

Temperature Sensor

[MSB/LSB]

ADC Segmentation: Bridge

Sensor [MSB/LSB]

Typical Measurement

[ms]

Typical 3-Sigma Noise for

SSC-Corrected Output

1)

[counts]

10 / 6

10 / 6

3.5

11.0

10 / 6

12 / 4

7.9

7.2

10 / 6

14 / 2

25.7

5.7

10 / 6

16 / 0

97.1

5.6

12 / 4

10 / 6

7.9

10.3

12 / 4

12 / 4

11.9

6.9

12 / 4

14 / 2

29.4

5.5

12 / 4

16 / 0

102.4

5.2

16 / 0

10 / 6

97.1

9.7

16 / 0

12 / 4

102.4

6.5

16 / 0

14 / 2

120.5

5.3

16 / 0

16 / 0

194.2

4.8

1)

Reference noise values obtained with this setup: 13.7k

Ω sensor bridge, 25°C, Gain=64, ADC shift=-1/16 through 15/16 (see below), VDD=1.8V.

The ADC offset is programmable in 8 steps so that the ADC input voltage range can be adapted to the voltage

The ADC offset is controlled by the A2D_Offset setting bits [12:10] in the Measurement Configuration Register