TLC5510AINS datasheet(5/20 Pages) TI1

5 / 20 page

TLC5510, TLC5510A

8-BIT HIGH-SPEED ANALOG-TO-DIGITAL CONVERTERS

SLAS095L – SEPTEMBER 1994 – REVISED JUNE 2003

POST OFFICE BOX 655303

• DALLAS, TEXAS 75265

operating characteristics at VDD = 5 V, VREFT = 2.5 V, VREFB = 0.5 V, f(CLK) = 20 MHz, TA = 25°C (unless

otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Maximum conversion rate

TLC5510

fI = 1 kHz ramp

VI(ANLG) = 0.5 V – 2.5 V

MSPS

fconv

Maximum conversion rate

TLC5510A

fI = 1-kHz ramp

VI(ANLG) = 0 V – 4 V

MSPS

Analog input bandwidth

At – 1 dB

MHz

td(D)

Digital output delay time

CL ≤ 10 pF (see Note 1 and Figure 1)

Differential gain

NTSC 40 Institute of Radio Engineers (IRE)

Differential phase

)

modulation wave,

fconv = 14.3 MSPS

0.7

degrees

tAJ

Aperture jitter time

td(s)

Sampling delay time

ten

Enable time, OE

↓ to valid data

CL = 10 pF

tdis

Disable time, OE

↑ to high impedance

CL = 10 pF

Input tone = 1 MHz

TA = 25°C

Input tone = 1 MHz

Full range

Input tone = 3 MHz

TA = 25°C

Spurious free dynamic range (SFDR)

Input tone = 3 MHz

Full range

Spurious free dynamic range (SFDR)

Input tone = 6 MHz

TA = 25°C

Input tone = 6 MHz

Full range

Input tone = 10 MHz

TA = 25°C

Input tone = 10 MHz

Full range

SNR

Signal to noise ratio

TA = 25°C

SNR

Signal-to-noise ratio

Full range

NOTE 1: CL includes probe and jig capacitance.

N+1

N+2

N+3

N+4

N – 3N – 2N – 1NN + 1

td(D)

CLK (clock)

ANALOG IN

(input signal)

D1 – D8

(output data)

tw(H)

tw(L)

td(s)

Figure 1. I/O Timing Diagram

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