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ADS5520IPAPR bảng dữ liệu(PDF) 13 Page - Texas Instruments

tên linh kiện ADS5520IPAPR
Giải thích chi tiết về linh kiện  12-Bit, 125 MSPS Analog-To-Digital Converter
PDF  38 Pages
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ADS5520IPAPR bảng dữ liệu(HTML) 13 Page - Texas Instruments

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DEFINITION OF SPECIFICATIONS
SNR + 10Log10
P
S
P
N
SINAD + 10Log10
P
S
P
N
) PD
ENOB +
SINAD * 1.76
6.02
ADS5520
www.ti.com....................................................................................................................................................... SBAS310F – MAY 2004 – REVISED OCTOBER 2008
Offset Error
Analog Bandwidth
The offset error is the difference, given in number of
The analog input frequency at which the power of the
LSBs, between the ADC's actual average idle
fundamental is reduced by 3 dB with respect to the
channel output code and the ideal average idle
low frequency value.
channel output code. This quantity is often mapped
into mV.
Aperture Delay
Temperature Drift
The delay in time between the falling edge of the
input sampling clock and the actual time at which the
The temperature drift coefficient (with respect to gain
sampling occurs.
error and offset error) specifies the change per
degree Celsius of the parameter from TMIN to TMAX. It
Aperture Uncertainty (Jitter)
is calculated by dividing the maximum deviation of
The sample-to-sample variation in aperture delay.
the parameter across the TMIN to TMAX range by the
difference (TMAX – TMIN).
Clock Pulse Width/Duty Cycle
Signal-to-Noise Ratio (SNR)
The duty cycle of a clock signal is the ratio of the time
the clock signal remains at a logic high (clock pulse
SNR is the ratio of the power of the fundamental (PS)
width) to the period of the clock signal. Duty cycle is
to the noise floor power (PN), excluding the power at
typically expressed as a percentage. A perfect
dc and the first eight harmonics.
differential sine wave clock results in a 50% duty
cycle.
Maximum Conversion Rate
SNR is either given in units of dBc (dB to carrier)
The maximum sampling rate at which certified
when the absolute power of the fundamental is used
operation is given. All parametric testing is performed
as the reference or dBFS (dB to Full-Scale) when the
at this sampling rate unless otherwise noted.
power of the fundamental is extrapolated to the
Minimum Conversion Rate
converter's full-scale range.
The minimum sampling rate at which the ADC
Signal-to-Noise and Distortion (SINAD)
functions.
SINAD is the ratio of the power of the fundamental
Differential Nonlinearity (DNL)
(PS) to the power of all the other spectral components
including noise (PN) and distortion (PD), but excluding
An ideal ADC exhibits code transitions at analog input
dc.
values spaced exactly 1LSB apart. The DNL is the
deviation of any single step from this ideal value,
measured in units of LSBs.
Integral Nonlinearity (INL)
SINAD is either given in units of dBc (dB to carrier)
when the absolute power of the fundamental is used
The INL is the deviation of the ADC's transfer
as the reference or dBFS (dB to full-scale) when the
function from a best fit line determined by a least
power of the fundamental is extrapolated to the
squares curve fit of that transfer function, measured
converter's full-scale range.
in units of LSBs.
Effective Number of Bits (ENOB)
Gain Error
The ENOB is a measure of a converter's performance
The gain error is the deviation of the ADC's actual
as compared to the theoretical limit based on
input full-scale range from its ideal value. The gain
quantization noise.
error is given as a percentage of the ideal input
full-scale range. Gain error does not account for
variations in the internal reference voltages (see the
Electrical Specifications section for limits on the
variation of VREFP and VREFM).
Copyright © 2004–2008, Texas Instruments Incorporated
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