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STI10N62K3 bảng dữ liệu(PDF) 4 Page - STMicroelectronics |
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STI10N62K3 bảng dữ liệu(HTML) 4 Page - STMicroelectronics |
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4 / 17 page ![]() Electrical characteristics STF10N62K3, STFI10N62K3, STI10N62K3, STP10N62K3 4/17 Doc ID 15640 Rev 4 2 Electrical characteristics (Tcase = 25 °C unless otherwise specified) Table 4. On /off states Symbol Parameter Test conditions Min. Typ. Max. Unit V(BR)DSS Drain-source breakdown voltage ID = 1 mA, VGS = 0 620 V IDSS Zero gate voltage drain current (VGS = 0) VDS = 620 V VDS = 620 V, TC=125 °C 1 50 µA µA IGSS Gate-body leakage current (VDS = 0) VGS = ± 20 V ±10 µA VGS(th) Gate threshold voltage VDS = VGS, ID = 100 µA 3 3.75 4.5 V RDS(on) Static drain-source on resistance VGS = 10 V, ID = 4 A 0.68 0.75 Ω Table 5. Dynamic Symbol Parameter Test conditions Min. Typ. Max. Unit gfs (1) 1. Pulsed: pulse duration = 300 µs, duty cycle 1.5% Forward transconductance VDS = 15 V, ID = 4 A - 6 - S Ciss Coss Crss Input capacitance Output capacitance Reverse transfer capacitance VDS = 50 V, f = 1 MHz, VGS = 0 - 1250 138 16 - pF pF pF Co(tr) (2) 2. Coss eq. time related is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80% VDSS Equivalent capacitance time related VDS = 0 to 496 V, VGS = 0 - 56 - pF Co(er) (3) 3. Coss eq. energy related is defined as a constant equivalent capacitance giving the same stored energy as Coss when VDS increases from 0 to 80% VDSS Equivalent capacitance energy related VDS = 0 to 496 V, VGS = 0 - 38 - pF RG Gate input resistance f=1 MHz Gate DC Bias=0 Test signal level = 20 mV open drain -3.5 - Ω Qg Qgs Qgd Total gate charge Gate-source charge Gate-drain charge VDD = 496 V, ID = 8 A, VGS = 10 V (see Figure 18) - 42 7.4 23 - nC nC nC |
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