74ABT16652CSSC datasheet(4/9 Pages) FAIRCHILD

4 / 9 page

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Absolute Maximum Ratings(Note 2)

Recommended Operating

Conditions

Note 2: Absolute maximum ratings are values beyond which the device

may be damaged or have its useful life impaired. Functional operation

under these conditions is not implied.

Note 3: Either voltage limit or current limit is sufficient to protect inputs.

DC Electrical Characteristics

Note 4: Guaranteed but not tested.

Storage Temperature

−65°C to +150°C

Ambient Temperature under Bias

−55°C to +125°C

Junction Temperature under Bias

−55°C to +150°C

VCC Pin Potential to

Ground Pin

−0.5V to +7.0V

Input Voltage (Note 3)

−0.5V to +7.0V

Input Current (Note 3)

−30 mA to +5.0 mA

Voltage Applied to Any Output

in the Disable or Power-Off State

−0.5V to +5.5V

in the HIGH State

−0.5V to V

Current Applied to Output

in LOW State (Max)

twice the rated IOL (mA)

DC Latchup Source Current

−500 mA

Over Voltage Latchup (I/O)

10V

Free Air Ambient Temperature

−40°C to +85°C

Supply Voltage

+4.5V to +5.5V

Minimum Input Edge Rate (

∆V/∆t)

Data Input

50 mV/ns

Enable Input

20 mV/ns

Clock Input

100 mV/ns

Symbol

Parameter

Min

Typ

Max

Units

VCC

Conditions

VIH

Input HIGH Voltage

Recognized HIGH Signal

VIL

Input LOW Voltage

0.8

Recognized LOW Signal

VCD

Input Clamp Diode Voltage

−1.2

Min

IIN = −18 mA (Non I/O Pins)

VOH

Output HIGH

2.5

Min

IOH = −3 mA, (An, Bn)

Voltage

2.0

IOH = −32 mA, (An, Bn)

VOL

Output LOW Voltage

0.55

Min

IOL = 64 mA, (An, Bn)

VID

Input Leakage Test

0.0

IID = 1.9 µA, (Non-I/O Pins)

All Other Pins Grounded

IIH

Input HIGH Current

µA

Max

VIN = 2.7V (Non-I/O Pins) (Note 4)

VIN = VCC (Non-I/O Pins)

IBVI

Input HIGH Current

µA

Max

VIN = 7.0V (Non-I/O Pins)

Breakdown Test

IBVIT

Input HIGH Current

100

µA

Max

VIN = 5.5V (An, Bn)

Breakdown Test (I/O)

IIL

Input LOW Current

−1

µA

Max

VIN = 0.5V (Non-I/O Pins) (Note 4)

−1

VIN = 0.0V (Non-I/O Pins)

IIH + IOZH

Output Leakage Current

µA

0V–5.5V

VOUT = 2.7V (An, Bn);

OEABn = GND and OEBAn = 2.0V

IIL + IOZL

Output Leakage Current

−10

µA

0V–5.5V

VOUT = 0.5V (An, Bn);

OEABn = GND and OEBAn = 2.0V

IOS

Output Short-Circuit Current

−275

Max

VOUT = 0V (An, Bn)

ICEX

Output HIGH Leakage Current

µA

Max

VOUT = VCC (An, Bn)

IZZ

Bus Drainage Test

100

µA

0.0V

VOUT = 5.5V (An, Bn); All Others GND

ICCH

Power Supply Current

1.0

Max

All Outputs HIGH

ICCL

Power Supply Current

Max

All Outputs LOW

ICCZ

Power Supply Current

1.0

Max

Outputs 3-STATE;

All Others at VCC or GND

ICCT

Additional ICC/Input

2.5

Max

VI = VCC − 2.1V

All Others at VCC or GND

ICCD

Dynamic ICC

No Load

0.23

mA/MHz

Max

Outputs Open

(Note 4)

OEABn, OEBAn and SEL = GND

Non-I/O

= GND or V

One bit toggling, 50% duty cycle

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