33663 datasheet(14/37 Pages) FREESCALE

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Analog Integrated Circuit Device Data



Freescale Semiconductor

33663

ELECTRICAL CHARACTERISTICS

DYNAMIC ELECTRICAL CHARACTERISTIC

Table 6. Dynamic Electrical Characteristics

Characteristics noted under conditions 7.0 V

 VSUP  18 V, -40 C  TA  125 C, GND = 0 V, unless otherwise noted.

Typical values noted reflect the approximate parameter means at TA = 25 °C under nominal conditions, unless otherwise noted.

Characteristic

Symbol

Min

Typ

Max

Unit

LIN1, LIN2 PHYSICAL LAYER

DRIVERS CHARACTERISTICS FOR NORMAL SLEW RATE - 20.0 KBIT/SEC ACCORDING TO LIN PHYSICAL LAYER

SPECIFICATION(16)(17)

33663L AND 33663S DEVICE

Duty Cycle 1:

THREC(MAX) = 0.744 * VSUP; THDOM(MAX) = 0.581 * VSUP

D1 = tBUS_REC(MIN)/(2 x tBIT), tBIT = 50 µs, 7.0 V VSUP18 V

0.396

–

Duty Cycle 2:

THREC(MIN) = 0.422 * VSUP; THDOM(MIN) = 0.284 * VSUP

D2 = tBUS_REC(MAX)/(2 x tBIT), tBIT = 50 µs, 7.6 V VSUP18 V

–

0.581

LIN1, LIN2 PHYSICAL LAYER

DRIVERS CHARACTERISTICS FOR SLOW SLEW RATE - 10.4 KBIT/SEC ACCORDING TO LIN PHYSICAL LAYER

SPECIFICATION(16)(18)

33663J DEVICE

Duty Cycle 3:

THREC(MAX) = 0.778 * VSUP; THDOM(MAX) = 0.616 * VSUP

D3 = tBUS_REC(MIN)/(2 x tBIT), tBIT = 96 µs, 7.0 V VSUP18 V

0.417

–

Duty Cycle 4:

THREC(MIN) = 0.389 * VSUP; THDOM(MIN) = 0.251 * VSUP

D4 = tBUS_REC(MAX)/(2 x tBIT), tBIT = 96 µs, 7.6 V VSUP18 V

–

0.590

LIN1, LIN2 PHYSICAL LAYER - DRIVERS CHARACTERISTICS FOR FAST SLEW RATE

Fast Bit Rate (Programming Mode)

BRFAST

–

100

kBit/s

LIN1, LIN2 PHYSICAL LAYER - TRANSMITTER CHARACTERISTICS FOR NORMAL SLEW RATE - 20.0 KBIT/SEC(19)

33663S DEVICE

Symmetry of Transmitter delay(20)

tTRAN_SYM = MAX (tTRAN_SYM60%, tTRAN_SYM40%)

tTRAN_SYM60% = | tTRAN_PDF60% - tTRAN_PDR60% |

tTRAN_SYM40% = | tTRAN_PDF40% - tTRAN_PDR40% |

tTRAN_SYM

-7.25

–

7.25

s

Notes

16.

Bus load RBUS and CBUS 1.0 nF / 1.0 k, 6.8 nF / 660, 10 nF / 500 . Measurement thresholds: 50% of TXD signal to LIN signal

threshold defined at each parameter. See Figure 8.

17.

See Figure 9

18.

See Figure 10

19.

VSUP from 7.0 to 18 V, bus load RBUS and CBUS 1.0 nF / 1.0 k, 6.8 nF / 660 , 10 nF / 500 . Measurement thresholds: 50% of TXD

signal to LIN signal threshold defined at each parameter. See Figure 8.

20.

See Figure 11

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