CB45000 datasheet(8/16 Pages) STMICROELECTRONICS

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CB45000 SERIES

8/16

which are true LSSD cells. Non-overlapping clock

generator macros are also available.

For parametric and Iddq testing, the I/O cells

contain a dedicated test interface as described

previously (See “I/O TEST INTERFACE” on

page 6.)

EVALUATION DEVICE

An evaluation device is used to demonstrate the

performance of the CB45000 series as well as

verify the effectiveness of the design system. The

device has path delays, latches and a set of

macrocells and memory functions which were

used to verify the simulated characteristics that

are supplied in the data book. Characterization of

the path delays including interconnect shows

typical delays of 160 ps for a 2 input NAND with

receivers/drivers operating at frequencies of 200

MHz. The evaluation device is available in a 208

pin plastic quad ﬂat pack.

Figure 5

Evaluation Device Cross Section

CB45000 bảng dữ liệu(PDF) 8 Page - STMicroelectronics