DS501-00024-6v1-E

15

MB85R4M2T



ESD AND LATCH-UP

Test

DUT

Value

ESD HBM (Human Body Model)

JESD22-A114 compliant

MB85R4M2TFN-G-JAE2

≥ |2000 V|

ESD MM (Machine Model)

JESD22-A115 compliant

≥ |200 V|

ESD CDM (Charged Device Model)

JESD22-C101 compliant

―

Latch-Up (I-test)

JESD78 compliant

―

Latch-Up (Vsupply overvoltage test)

JESD78 compliant

―

Latch-Up (Current Method)

Proprietary method

―

Latch-Up (C-V Method)

Proprietary method

≥ |200 V|

・

Current method of Latch-Up Resistance Test

Note: The voltage VIN is increased gradually and the current IIN of 300 mA at maximum shall flow.

Confirm the latch up does not occur under IIN =±300 mA.

In case the specific requirement is specified for I/O and IIN cannot be 300 mA, the voltage shall be

increased to the level that meets the specific requirement.