ST72324BJ2 datasheet(152/188 Pages) STMICROELECTRONICS

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Electrical characteristics

ST72324B

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12.8.3

Absolute maximum ratings (electrical sensitivity)

Based on three different tests (ESD, LU and DLU) using specific measurement methods, the

product is stressed in order to determine its performance in terms of electrical sensitivity.

For more details, refer to the application note AN1181.

Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size

depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models

can be simulated: Human Body Model and Machine Model. This test conforms to the

JESD22-A114A/A115A standard.

Static and dynamic Latch-Up

●

LU: 3 complementary static tests are required on 10 parts to assess the latch-up

performance. A supply overvoltage (applied to each power supply pin) and a current

injection (applied to each input, output and configurable I/O pin) are performed on each

sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details,

refer to the application note AN1181.

●

DLU: Electrostatic discharges (one positive then one negative test) are applied to each

pin of three samples when the micro is running to assess the latch-up performance in

dynamic mode. Power supplies are set to the typical values, the oscillator is connected

as near as possible to the pins of the micro and the component is put in reset mode.

This test conforms to the IEC1000-4-2 and SAEJ1752/3 standards. For more details,

refer to the application note AN1181.

Table 103.

Absolute maximum ratings

Symbol

Ratings

Conditions

Maximum value(1)

Data based on characterization results, not tested in production.

Unit

VESD(HBM)

Electrostatic discharge voltage

(human body model)

TA = +25°C

2000

VESD(MM)

Electrostatic discharge voltage

(machine model)

200

VESD(CDM)

Electrostatic discharge voltage

(charged device model)

750

Table 104.

Electrical sensitivities

Symbol

Parameter

Conditions

Test

specification

Test result

Static latch-up class

TA = +25°C

TA = +85°C

TA = +125°C

EIA/JESD 78

Passed

DLU

Dynamic latch-up class

VDD = 5.5V

fOSC = 4MHz

TA = +25°C

IEC1000-4-2

and

SAEJ1752/3

Passed

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