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P4C163-35JM bảng dữ liệu(PDF) 3 Page - Pyramid Semiconductor Corporation

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P4C163/163L
Page 3 of 12
Document # SRAM120 REV C
POWER DISSIPATION CHARACTERISTICS
Over recommended operating temperature and supply voltage(2)
P4C163
P4C163L
Min
Max
Min
Max
I
CC
Dynamic Operating
V
CC = Max., f = Max.,
Mil.
—
145
—
145
mA
Current – 25
Outputs Open
Com’l.
—
125
—
N/A
I
CC
Dynamic Operating
V
CC = Max., f = Max.,
Mil.
—
120
—
120
mA
Current – 35, 45
Outputs Open
Com’l.
—
95
—
N/A
I
SB
Standby Power Supply
CE
1 ≥ VIH or
Mil.
—
40
—
40
mA
Current (TTL Input Levels) CE
2 ≤ VIL, VCC = Max.,
Com’l.
—
35
—
N/A
f = Max., Outputs Open
I
SB1
Standby Power Supply
CE
1 ≥ VHC or
Mil.
—
20
—
1
mA
Current
CE
2 ≤ VLC, VCC = Max.,
Com’l.
—
18
—
N/A
(CMOS Input Levels)
f = 0, Outputs Open,
V
IN ≤ VLC or VIN ≥ VHC
DATA RETENTION WAVEFORM
Symbol
Parameter
Test Conditions
Unit
n/a = Not Applicable
DATA RETENTION CHARACTERISTICS (P4C163L, Military Temperature Only)
Typ.*
Max
Symbol
Parameter
Test Condition
Min
V
CC=VCC=Unit
2.0V
3.0V
2.0V
3.0V
V
DR
V
CC for Data Retention
2.0
V
I
CCDR
Data Retention Current
10
15
200
300
µA
t
CDR
Chip Deselect to
0
ns
Data Retention Time
t
R
†
Operation Recovery Time
t
RC
§
ns
*T
A = +25°C
§
t
RC = Read Cycle Time
†
This parameter is guaranteed but not tested.
CE
1 ≥ VCC – 0.2V or
CE
2 ≤ 0.2V, VIN ≥ VCC – 0.2V
or V
IN ≤ 0.2V



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