SAA5281ZP datasheet(8/48 Pages) PHILIPS

8 / 48 page

1996 Nov 04

Philips Semiconductors

Preliminary speciﬁcation

Integrated Video input processor and

Teletext decoder (IVT1.8*)

SAA5281

QUALITY AND RELIABILITY

This device will meet Philips Semiconductors General Quality Specification for Business group

“Consumer Integrated

Circuits SNW-FQ-611-Part E”. The principal requirements are shown in Tables 1 to 4.

Group A

Table 1

Acceptance tests per lot

Group B

Table 2

Processability tests (by package family)

Group C

Table 3

Reliability tests (by process family)

Table 4

Reliability tests (by device type)

Notes to Tables 1 to 4

1. ppm = fraction of defective devices, in parts per million.

LTPD = Lot Tolerance Percent Defective.

FPM = fraction of devices failing at test condition, in Failures Per Million.

FITS = Failures In Time Standard.

TEST

REQUIREMENTS(1)

Mechanical

cumulative target:

<100 ppm

Electrical

cumulative target:

<100 ppm

TEST

REQUIREMENTS(1)

Solderability

<7% LTPD

Mechanical

<15% LTPD

Solder heat resistance

<15% LTPD

TEST

CONDITIONS

REQUIREMENTS(1)

Operational life

168 hours at Tj = 150 °C

<1500 FPM; equivalent to

<100 FITS at Tj =70 °C

Humidity life

temperature, humidity, bias

1000 hours, 85

°C, 85% RH

(or equivalent test)

<2000 FPM

Temperature cycling performance

Tstg(min) to Tstg(max)

<2000 FPM

TEST

CONDITIONS

REQUIREMENTS(1)

ESD and latch-up

ESD Human body model

2000 V, 100 pF, 1.5 k

Ω

<15% LTPD

ESD Machine model

200 V, 200 pF, 0

Ω

<15% LTPD

latch-up 100 mA, 1.5

× VDD

(absolute maximum)

<15% LTPD

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