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S32K311NHT0MPAST bảng dữ liệu(PDF) 132 Page - NXP Semiconductors |
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S32K311NHT0MPAST bảng dữ liệu(HTML) 132 Page - NXP Semiconductors |
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132 / 143 page ![]() Rev 4, April 2022 — Table “STANDBY mode supply currents” — Table “Low speed RUN mode supply currents” — Table “RUN mode supply currents (peripherals disabled)” — Table “Example RUN mode configuration supply current” • In section “supply current”, Removed table “Recommended current limits in board design” and related sentence “The power supplies for the voltage ...." • In section “Power management”, added section ”Cyclic wake-up current” and removed table "Low-power, cyclic operation mode" from supply currents. • In section "GPIO DC electrical specifications, 3.3V Range (2.97V - 3.63V)",with symbol "ILKG_33_S", the condition has been changed from PTC0 to PTD0. • In section "5.0V (4.5V - 5.5V) GPIO Output AC Specification": — for Symbol "TR_TF_50_F" with condition "DSE=0, SRE=1, Capacitance=50pF" Min changed from "2.8" to "1.9". — for Symbol "TR_TF_50_F" with condition "DSE=0, SRE=1, Capacitance=50pF" Max changed from "10.2" to "7.7". — for Symbol "TR_TF_50_F" with condition "DSE=1, SRE=1, Capacitance=50pF" Min changed from "1.9" to "1.3". — for Symbol "TR_TF_50_F" with condition "DSE=1, SRE=1, Capacitance=50pF" Max changed from "6.7" to "5.1". — for Symbol "TR_TF_50_F" with condition "DSE=0, SRE=0, Capacitance=50pF" Min changed from "2.0" to "1.0". — for Symbol "TR_TF_50_F" with condition "DSE=0, SRE=0, Capacitance=50pF" Max changed from "7.4" to "5.3". — for Symbol "TR_TF_50_F" with condition "DSE=1, SRE=0, Capacitance=25pF" Min changed from "0.9" to "0.3". — for Symbol "TR_TF_50_F" with condition "DSE=1, SRE=0, Capacitance=25pF" Max changed from "3.0" to "0.9". — for Symbol "TR_TF_50_F" with condition "DSE=1, SRE=1, Capacitance=25pF" Min changed from "1.3" to "0.9". — for Symbol "TR_TF_50_F" with condition "DSE=1, SRE=1, Capacitance=25pF" Max changed from "5.1" to "4.1". — for Symbol "TR_TF_50_F" with condition "DSE=1, SRE=0, Capacitance=50pF" Min changed from "1.6" to "0.9". — for Symbol "TR_TF_50_F" with condition "DSE=1, SRE=0, Capacitance=50pF" Max changed from "3.6" to "3.0". — for Symbol "TR_TF_50_F" with condition "DSE=0, SRE=0, Capacitance=25pF" Min changed from "1.0" to "0.4". — for Symbol "TR_TF_50_F" with condition "DSE=0, SRE=0, Capacitance=25pF" Max changed from "5.3" to "3.1". — for Symbol "TR_TF_50_F" with condition "DSE=0, SRE=1, Capacitance=25pF" Min changed from "1.9" to "1.5". — for Symbol "TR_TF_50_F" with condition "DSE=0, SRE=1, Capacitance=25pF" Max changed from "7.7" to "6.1". • In section “SAR ADC“, the footnote attached to “ADC Total Unadjusted Error” is updated as “TUE spec for precision and standard channels is based on 12-bit level resolution”. • In section "Supply Diagnosis", for Symbol "AN_ACC" and "AN_T_on" footnote added "These specs will have degraded performan..." • In section "Fast External Oscillator (FXOSC)", for Symbol "TFXOSC" description changed from "Fxosc start up time" to "Fxosc start up time (ALC enabled)". • In section "Fast External Oscillator (FXOSC)", removed the crystal part numbers and related information which includes following sentences, "In crystal mode NX5032GA crystal .....", " In crystal mode NX8045GB crystal …" and updated sentence "To ensure stable oscillations, FXOSC incorporates the feedback resistance internally.". • In section "LPSPI", updated the sentence updated maximum output load of 50pF to 30pF. NXP Semiconductors Revision history S32K3xx Data Sheet, Rev. 9.1, 03/2024 Data Sheet: Technical Data Preliminary Information for S32K388 132 / 143 |
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