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LXT6155LE bảng dữ liệu(PDF) 37 Page - Intel Corporation

tên linh kiện LXT6155LE
Giải thích chi tiết về linh kiện  155 Mbps SDH/SONET/ATM Transceiver
PDF  50 Pages
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nhà sản xuất  INTEL [Intel Corporation]
Trang chủ  http://www.intel.com
Logo INTEL - Intel Corporation

LXT6155LE bảng dữ liệu(HTML) 37 Page - Intel Corporation

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Datasheet
37
155 Mbps SDH/SONET/ATM Transceiver — LXT6155
5.0
Test Specifications
Information in Table 25 through 34 and Figures 18 through 28 represent the performance
specifications of the LXT6155 and are guaranteed by test, except as noted by design.
Table 25. Absolute Maximum Ratings
Parameter
Sym
Min
Max
Unit
DC supply (reference to GND)
Vcc
4.0
V
Input voltage, TTL pins
Vin (TTL)
GND -0.3
5.5
V
Input voltage, other pins
Vin
GND -0.3
VCC +0.3
V
Input current, any pin
Iin
-10
25
mA
Storage temperature
Tstg
-65
150
°C
CAUTION
Operating at or beyond these limits may result in damage to the device.
Normal operation not guaranteed at these extremes.
Table 26. Recommended Operating Conditions
Parameter
Sym
Min
Typ
Max
Unit
DC supply (referenced to GND)
Vcc
3.0
3.3
3.6
V
Ambient operating temperature
Ta
-40
25
85
°C
Total current consumption
serial/fiber
serial/coax
parallel/fiber
parallel/coax
150
210
100
150
mA
Table 27. DC Electrical Characteristics (Vcc =3.0 V to3.6 V; TA =-40 °C to85°C)
Parameter
Sym
Min
Typ
1
Max
Unit
Test Conditions
High level input voltage (LVPECL)
Vih1
Vcc-1.03
Vcc-0.88
V
Low level input voltage (LVPECL)
Vil1
Vcc-1.81
Vcc-1.62
V
High level output voltage (LVPECL)
Voh1
Vcc-1.03
Vcc-0.95
Vcc-0.88
V
50
Ω pulled down to
VCC -2.0 V.
Low level output voltage (LVPECL)
Vol1
Vcc-1.81
Vcc-1.70
Vcc-1.62
V
High level input voltage (TTL)
Vih2
2.0
V
Low level input voltage (TTL)
Vil2
0.8
V
High level output voltage (TTL)
Voh2
2.4
V
IOH =4mA
Low level output voltage (TTL)
Vol2
0.4
V
IOL =4 mA
Input leakage current, low (TTL)
Ill
10
µA
Input leakage current, high (TTL)
Ilh
10
µA
1 Typical values are at 25C and 3.3V. They are for design aid only; not guaranteed and not subject to production testing.



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