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S12SCIV3/D bảng dữ liệu(PDF) 91 Page - NXP Semiconductors

tên linh kiện S12SCIV3/D
Giải thích chi tiết về linh kiện  The SoC Guide provides information about the MC9S12KG128 device made up of standard HCS12 blocks and the HCS12 processor core
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MC9S12KG128 SoC Guide — V01.01
Table A-22 Expanded Bus Timing Characteristics
Conditions are shown in Table A-4 unless otherwise noted, CLOAD = 50pF
Num
C
Rating
Symbol
Min
Typ
Max
Unit
1
P
Frequency of operation (E-clock)
fo
0
25.0
MHz
2
P
Cycle time
tcyc
40
ns
3
D
Pulse width, E low
PWEL
19
ns
4D
Pulse width, E high1
PWEH
19
ns
5
D
Address delay time
tAD
8ns
6D
Address valid time to E rise (PWEL–tAD)tAV
11
ns
7
D
Muxed address hold time
tMAH
2ns
8
D
Address hold to data valid
tAHDS
7ns
9
D
Data hold to address
tDHA
2ns
10
D
Read data setup time
tDSR
13
ns
11
D
Read data hold time
tDHR
0ns
12
D
Write data delay time
tDDW
7ns
13
D
Write data hold time
tDHW
2ns
14
D
Write data setup time(1) (PWEH–tDDW)
tDSW
12
ns
15
D
Address access time(1) (tcyc–tAD–tDSR)
tACCA
19
ns
16
D
E high access time(1) (PWEH–tDSR)
tACCE
6ns
17
D
Non-multiplexed address delay time
tNAD
6ns
18
D
Non-muxed address valid to E rise (PWEL–tNAD)tNAV
13
ns
19
D
Non-multiplexed address hold time
tNAH
2ns
20
D
Chip select delay time
tCSD
16
ns
21
D
Chip select access time(1) (tcyc–tCSD–tDSR)
tACCS
11
ns
22
D
Chip select hold time
tCSH
2ns
23
D
Chip select negated time
tCSN
8ns
24
D
Read/write delay time
tRWD
7ns
25
D
Read/write valid time to E rise (PWEL–tRWD)tRWV
14
ns
26
D
Read/write hold time
tRWH
2ns
27
D
Low strobe delay time
tLSD
7ns
28
D
Low strobe valid time to E rise (PWEL–tLSD)tLSV
14
ns
29
D
Low strobe hold time
tLSH
2ns
30
D
NOACC strobe delay time
tNOD
7ns
31
D
NOACC valid time to E rise (PWEL–tLSD)tNOV
14
ns
Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com



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