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MC56F81663 bảng dữ liệu(PDF) 54 Page - NXP Semiconductors

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Giải thích chi tiết về linh kiện  DSC based on 32-bit 56800EX core
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MC56F81663 bảng dữ liệu(HTML) 54 Page - NXP Semiconductors

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Table 24. NVM program/erase timing specifications (continued)
Symbol
Description
Min.
Typ.
Max.
Unit
Notes
thversscr
Sector Erase high-voltage time
13
113
ms
1
thversall
Erase All high-voltage time
52
452
ms
1
1. Maximum time based on expectations at cycling end-of-life.
11.4.1.2 Flash timing specifications — commands
Table 25. Flash command timing specifications
Symbol
Description
Min.
Typ.
Max.
Unit
Notes
trd1sec1k
Read 1s Section execution time (flash sector)
60
μs
1
tpgmchk
Program Check execution time
45
μs
1
trdrsrc
Read Resource execution time
30
μs
1
tpgm4
Program Longword execution time
65
145
μs
tersscr
Erase Flash Sector execution time
14
114
ms
2
trd1all
Read 1s All Blocks execution time
1.8
ms
1
trdonce
Read Once execution time
25
μs
1
tpgmonce
Program Once execution time
65
μs
tersall
Erase All Blocks execution time
88
650
ms
2
tvfykey
Verify Backdoor Access Key execution time
30
μs
1
tersallu
Erase All Blocks Unsecure execution time
88
650
ms
2
1. Assumes 25 MHz flash clock frequency.
2. Maximum times for erase parameters based on expectations at cycling end-of-life.
11.4.1.3 Flash high voltage current behaviors
Table 26. Flash high voltage current behaviors
Symbol
Description
Min.
Typ.
Max.
Unit
IDD_PGM
Average current adder during high voltage
flash programming operation
2.5
6.0
mA
IDD_ERS
Average current adder during high voltage
flash erase operation
1.5
4.0
mA
11.4.1.4 Reliability specifications
Table 27. NVM reliability specifications
Symbol
Description
Min.
Typ.1
Max.
Unit
Notes
Program Flash
tnvmretp10k Data retention after up to 10 K cycles
5
50
years
tnvmretp1k Data retention after up to 1 K cycles
20
100
years
Table continues on the next page...
System modules
MC56F81xxx, Rev. 1.1, 12/2020
54
NXP Semiconductors



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