PCF2127TSLASH2Y datasheet(72/100 Pages) PHILIPS

72 / 100 page

PCF2127

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Product data sheet

Rev. 8 — 19 December 2014

72 of 100

NXP Semiconductors

PCF2127

Accurate RTC with integrated quartz crystal for industrial applications

12. Limiting values

[1]

Pass level; Human Body Model (HBM) according to Ref. 7 “JESD22-A114”.

[2]

Pass level; Charged-Device Model (CDM), according to Ref. 8 “JESD22-C101”.

[3]

Pass level; latch-up testing according to Ref. 9 “JESD78” at maximum ambient temperature (Tamb(max)).

[4]

According to the store and transport requirements (see Ref. 14 “UM10569”) the devices have to be stored at a temperature of +8

C to

+45

C and a humidity of 25 % to 75 %.

Table 89.

Limiting values

In accordance with the Absolute Maximum Rating System (IEC 60134).

Symbol

Parameter

Conditions

Min

Max

Unit

VDD

supply voltage

0.5

+6.5

IDD

supply current

50

+50

input voltage

0.5

+6.5

input current

10

+10

output voltage

0.5

+6.5

output current

10

+10

at pin SDA/CE

10

+20

VBAT

battery supply voltage

0.5

+6.5

Ptot

total power dissipation

300

VESD

electrostatic

discharge voltage

HBM

[1] -

4000

CDM

[2] -

1250

Ilu

latch-up current

[3] -200

Tstg

storage temperature

[4]

55

+85

C

Tamb

ambient temperature

operating device

40

+85

C

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