4225-RPM datasheet(7/45 Pages) TEKTRONIX

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Datasheet

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2. Source Measure Units (SMU)

Precision DC current vs. voltage (I-V) measurements are

the cornerstone of device and materials characterization.

World-class source measure unit (SMU) instruments

are at the core of the 4200A-SCS Parameter Analyzer.

A source measure unit can source either voltage or

current and can simultaneously measure both voltage

and current with high resolution and accuracy. The

SMU integrates the voltage source, current source,

ammeter and voltmeter in one instrument card for tight

synchronization of I-V measurements.

A source measure unit has four-quadrant capability, which

means it can not only source but also sinks current, as

when taking current from a device under test (DUT), such

as a charged capacitor or solar cell.

I-V sweep measurement.

The 4200A-SCS Parameter Analyzer can be configured

with up to nine SMUs. Four SMU models are available:

two medium power SMUs that have a range up to 210 V

and 100 mA and two high power SMUs that have a range

up to 210 V and 1 A. The 4201 and 4211 SMUs can

source into a fixture with a load capacitance of up to 10 µF

and 100 µF respectively depending on the current range.

(There is no spcified max fixture capacitance for the 4200

and 4210 SMUs, and they may oscillate when sourcing

into fixtures with higher than typical capacitances.)

All 4200A-SCS SMUs have shielded triaxial connections

with active guarding for low current and high impedance

measurements and 4-wire (Kelvin) force and sense

connections.

Field Installable SMUs

Need to replace or add SMUs to your existing 4200A-SCS

mainframe? Now available, a first-in-class field installable

SMU and SMU/PA. Eliminate the time-consuming

requirement of returning your parameter analyzer to

a service center just to add or replace SMUs. These

distinct SMUs can be installed at your facility and will

maintain their specifications over the standard one year

calibration cycle.

Extend Measurement Resolution to 10 aA

Many critical applications demand the ability to measure

very low currents – such as determining the gate leakage

current of FETs, testing sensitive nano-scale devices, and

measuring leakage current of insulators and capacitors.

When the SMUs are configured with the optional 4200-PA

Remote Preamp, they are capable of exceptionally low

current measurements. The 4200-PA provides 10 aA

resolution by adding additional current ranges to either

SMU model. To the user, the SMU simply appears to

have additional measurement resolution available.

Sub-fA measurements with optional 4200-PA preamplifier module.

The preamplifier is shipped installed on the back of

the 4200A-SCS mainframe. This installation allows for

standard cabling to a prober, test fixture or switch matrix.

The preamplifier can be removed from the back panel

and placed in a remote location (such as in a light-tight

enclosure or on a prober platen) to eliminate measurement

problems due to long cables. Platen mounts and triax

panel mount accessories are available.

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