STM32WB55CC datasheet(133/165 Pages) STMICROELECTRONICS

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DS11929 Rev 3

133/165

STM32WB55xx

Electrical characteristics

152

SINAD

Signal-to-

noise and

distortion

ratio

Single

ended

Fast channel (max speed)

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Slow channel (max speed)

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Differential

Fast channel (max speed)

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Slow channel (max speed)

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SNR

Signal-to-

noise ratio

Single

ended

Fast channel (max speed)

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Slow channel (max speed)

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Differential

Fast channel (max speed)

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Slow channel (max speed)

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THD

Total

harmonic

distortion

Single

ended

Fast channel (max speed)

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Slow channel (max speed)

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Differential

Fast channel (max speed)

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Slow channel (max speed)

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1. Guaranteed by design.

2. ADC DC accuracy values are measured after internal calibration.

Injecting negative current on any analog input pin should be avoided as this significantly reduces the accuracy of the

conversion being performed on another analog input. It is recommended to add a Schottky diode (pin to ground) to analog

pins that may potentially inject negative current.

4. The I/O analog switch voltage booster is enabled when VDDA < 2.4 V (BOOSTEN = 1 in the SYSCFG_CFGR1 when

VDDA < 2.4 V). It is disabled when VDDA ≥ 2.4 V. No oversampling.

Table 76. ADC accuracy - Limited test conditions 2(1)(2)(3) (continued)

Symbol

Parameter

Conditions(4)

Min

Typ

Max

Unit

Table 77. ADC accuracy - Limited test conditions 3(1)(2)(3)

Symbol Parameter

Conditions(4)

Min

Typ

Max

Unit

Total

unadjusted

error

Single

ended

Fast channel (max speed)

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LSB

Slow channel (max speed)

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Differential

Fast channel (max speed)

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Slow channel (max speed)

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Offset error

Single

ended

Fast channel (max speed)

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Slow channel (max speed)

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Differential

Fast channel (max speed)

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Slow channel (max speed)

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Gain error

Single

ended

Fast channel (max speed)

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Slow channel (max speed)

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Differential

Fast channel (max speed)

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Slow channel (max speed)

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