TS8388BVFS datasheet(11/57 Pages) ATMEL

11 / 57 page

TS8388B

2144C–BDC–04/03

Explanation of

Test Levels

Notes:

1. Unless otherwise specified, all tests are pulsed tests: therefore Tj = Tc = Ta, where Tj, Tc

and Ta are junction, case and ambient temperature respectively.

2. Refer to “Ordering Information” on page 50.

3. Only MIN and MAX values are guaranteed (typical values are issuing from characterization

results).

Functions

Description

Table 4. Explanation of Test Levels

Num

Characteristics

100% production tested at +25

°C(1) (for “C” Temperature range(2)).

100% production tested at +25

°C(1), and sample tested at specified temperatures

(for “V” and “M” Temperature range(2)).

Sample tested only at specified temperatures.

Parameter is guaranteed by design and characterization testing (thermal steady-state

conditions at specified temperature).

Parameter is a typical value only.

100% production tested over specified temperature range

(for “B/Q” Temperature range(2)).

Table 5. Functions Description

Name

Function

VCC

Positive power supply

Analog negative power supply

VPLUSD

Digital positive power supply

GND

Ground

IN, VINB

Differential analog inputs

CLK, CLKB

Differential clock inputs

<D0:D7>

<D0B:D7B>

Differential output data port

DR, DRB

Differential data ready outputs

OR, ORB

Out of range outputs

GAIN

ADC gain adjust

GORB

Gray or Binary digital output select

DIOD/DRRB

Die junction temperature measurement/

asynchronous data ready reset

VIN

VINB

CLK

CLKB

D0B

D7B

DVEE = -5V

VCC = +5V

VPLUSD = +0V (ECL)

VPLUSD = +2.4V (LVDS)

TS8388B

VEE = -5V

GND

GAIN

GORG

DIOD/

DRRB

ORB

DRB

TS8388BVFS bảng dữ liệu(PDF) 11 Page - ATMEL Corporation

TS8388BVFS bảng dữ liệu(HTML) 11 Page - ATMEL Corporation

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57

bảng dữ liệu tải về

Link URL