L9634 datasheet(8/36 Pages) STMICROELECTRONICS

8 / 36 page

L9634

8/36

Figure 5. MOS Settling time and turn-on time 2

2. Application information only; not tested.

3. Time from Falling edge of CS until SPI “diagnostic” flag is set.

Table 5. Electrical Characteristics

Symbol

Parameter

Test Condition

Min.

Typ.

Max.

Unit

tP_ACC

Pulse Stretch Timer Accuracy

-20

tGLITCH

Pulse Stretcher De-glitch timer

µs

tDEPLOY

Deployment Time

VRES = 6.9 - 40V2;

(see table)

22.25

VRES = 12 – 21V3;

(see table)

44.5

tTIMEOUT

Diagnostic Bias Current Time

Time from falling edge of CS until

SPI diagnostic complete flag is

set, in case of Short to GND for a

single channel diagnostic.

2.5

tFLT_DLY

Fault Detection Filter2

µs

ISLEW

Rmeas Current di/dt

mA/

µs

tRES

Resistance Measurement

Time2

Duration when IDIAG_SRC and

IDIAG_SINK are connected to SQH

and SQL during a Resistance

Measurement

2.5

tMOS_ON

MOS test

turn-on time2

On-time of a LS/HS driver during

a MOS test

2.5

tDETECT

MOS test

detection window2

Time window to check for a LS/

HS MOS fault on a single loop

7.5

tPROP_DLY

LS/HS MOS turn off

propagation delay2

Time is measured from the valid

LS/HS MOS condition to the LS/

HS turn off

µs

tDIAG1

Diagnostic Time3

For a single loop;

MOS Test Disabled

5ms

tDIAG_MULT

For 8 loops

MOS Tests Disabled

Obsolete

Product(s)

- Obsolete

Product(s)

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