SST39VF401C datasheet(18/38 Pages) MICROCHIP

18 / 38 page

DS20005053B

04/14

4 Mbit (x16) Multi-Purpose Flash Plus

SST39VF401C / SST39VF402C / SST39LF401C / SST39LF402C

Data Sheet

Table 14: Recommended System Power-up Timings

Symbol

Parameter

Minimum

Units

TPU-READ1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this

parameter.

Power-up to Read Operation

100

µs

TPU-WRITE1

Power-up to Program/Erase Operation

100

µs

T14.0 25053

Table 15: Capacitance (TA = 25°C, f=1 Mhz, other pins open)

Parameter

Description

Test Condition

Maximum

CI/O1

1. This parameter is measured only for initial qualification and after a design or process change that could affect this

parameter.

I/O Pin Capacitance

VI/O =0V

12pF

CIN1

Input Capacitance

VIN =0V

6pF

T15.0 25053

Table 16: Reliability Characteristics

Symbol

Parameter

Minimum Specification

Units

Test Method

NEND1,2

1. This parameter is measured only for initial qualification and after a design or process change that could affect this

parameter.

2. NEND endurance rating is qualified as a 10,000 cycle minimum for the whole device. A sector- or block-level rating would

result in a higher minimum specification.

Endurance

10,000

Cycles

JEDEC Standard A117

TDR1

Data Retention

100

Years

JEDEC Standard A103

ILTH1

Latch Up

100 + IDD

JEDEC Standard 78

T16.2 25053

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