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PI5V331 bảng dữ liệu(PDF) 3 Page - Pericom Semiconductor Corporation

tên linh kiện PI5V331
Giải thích chi tiết về linh kiện  Low ON Resistance Wideband/Video Dual 4-Channel Mux/Demux
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PS8117
08/07/97
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PI5V331
Low ON Resistance Wideband Video
Dual 4-Channel Mux/Demux
Dynamic Characteristics (Over the Operating Range, TA = –40°C to +85°C, VCC = 5V ±5%)
Parameter
Description
Test Conditions
Min.
Typ.
Max.
Units
tON
Turn On Time
RL = 75
Ω, CL = 20 pF, see Fig. 2
—
2.5
5
ns
tOFF
Turn Off Time
RL = 75
Ω, CL = 20 pF, see Fig. 2
—
1.1
5
ns
BW(1)
–3 dB Bandwidth
RL = 150
Ω, see Fig. 3
150
—
—
MHz
XTALK
Crosstalk
RIN = 10
Ω; RL = 150Ω, 10 MHz, see Fig. 3
—
–58
—
dB
DG
Differential Gain
RL = 150
Ω, f = 3.58 MHz, see Fig. 1
—
0.64
—
%
DP
Differential Phase
RL = 150
Ω, f = 3.58 MHz, see Fig. 1
—
0.27
—
Deg.
CIN(1)
Input/Enable Capacitance
VIN = 0V, f = 1 MHz
—
—
6
pF
COFF(1)
Capacitance, Switch Off
VIN = 0V, f = 1 MHz
—
—
6
pF
CON(1)
Capacitance, Switch On
VIN = 0V, f = 1 MHz
—
—
20
pF
OIRR
Off Isolation
RL = 150
Ω, 10 MHz, see Fig. 3
—
–38
—
dB
Power Supply Characteristics
Parameters Description
Test Conditions
(1)
Min.
Typ
(2)
Max.
Units
ICC
Quiescent Power
VCC = Max.
IN = GND or VCC
—
0.1
3.0
µA
Supply Current
∆ICC
Supply Current per
VCC = Max.
IN = 3.4V
(3)
—
—
2.5
mA
Input @ TTL HIGH
ICCD
Supply Current per
VCC = Max.,
—
—
0.25
mA/
Input per MHz
(4)
S1, S2, and D Pins Open
MHz
EN = GND
Control Input Toggling
50% Duty Cycle
Notes:
1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V, control inputs only); S1, S2, and D pins do not contribute to Icc.
4. This current applies to the control inputs only and represent the current required to switch internal capacitance at the specified
frequency. The S1, S2, and D I/O pins generate no significant AC or DC currents as they transition. This parameter is not tested,
but is guaranteed by design.
Notes:
1. This parameter is determined by device characterization but is not production tested.



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