LPV521 datasheet(8/34 Pages) TI1

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LPV521

SNOSB14D – AUGUST 2009 – REVISED DECEMBER 2014

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5-V DC Electrical Characteristics (continued)

Unless otherwise specified, all limits for TA = 25°C, V

+ = 5 V, V− = 0 V, V

CM = VO = V

+/2, and R

L > 1 MΩ.

(1)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Output Swing High

RL = 100 kΩ to V

+/2

VIN(diff) = 100 mV

Temperature extremes

mV from

either rail

Output Swing Low

RL = 100 kΩ to V

+/2

VIN (diff) = −100 mV

Temperature extremes

Output Current

Sourcing, VO to V

−

VIN(diff) = 100 mV

Temperature extremes

Sinking, VO to V

VIN(diff) = −100 mV

Temperature extremes

Supply Current

VCM = 0.3 V

351

400

Temperature extremes

620

VCM = 4.7 V

475

600

Temperature extremes

870

6.10 5-V AC Electrical Characteristics

(1)

Unless otherwise specified, all limits for TA = 25°C, V

+ = 5 V, V− = 0 V, V

CM = VO = V

+/2, and R

L > 1 MΩ.

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

(2)

(3)

(2)

GBW

Gain-Bandwidth Product

CL = 20 pF, RL = 100 kΩ

6.2

kHz

Slew Rate

AV = +1,

Falling Edge

1.1

2.7

VIN = 0 V to 5 V

Temperature

1.2

extremes

V/ms

Rising Edge

1.1

2.4

Temperature

1.2

extremes

θ m

Phase Margin

CL = 20 pF, RL = 100 kΩ

deg

Gain Margin

CL = 20 pF, RL = 100 kΩ

Input-Referred Voltage Noise Density

f = 100 Hz

255

nV/

√Hz

Input-Referred Voltage Noise

0.1 Hz to 10 Hz

μVPP

Input-Referred Current Noise

f = 100 Hz

100

fA/

√Hz

EMIRR

EMI Rejection Ratio, IN+ and IN

−(4)

VRF_PEAK = 100 mVP (−20 dBP),

121

f = 400 MHz

VRF_PEAK = 100 mVP (−20 dBP),

121

f = 900 MHz

VRF_PEAK = 100 mVP (−20 dBP),

124

f = 1800 MHz

VRF_PEAK = 100 mVP (−20 dBP),

142

f = 2400 MHz

(1)

Electrical Characteristics values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in

very limited self-heating of the device such that TJ = TA. No guarantee of parametric performance is indicated in the electrical tables

under conditions of internal self-heating where TJ TA. Absolute Maximum Ratings indicate junction temperature limits beyond which the

device may be permanently degraded, either mechanically or electrically.

(2)

All limits are guaranteed by testing, statistical analysis or design.

(3)

Typical values represent the most likely parametric norm at the time of characterization. Actual typical values may vary over time and

will also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production

material.

(4)

The EMI Rejection Ratio is defined as EMIRR = 20log (VRF_PEAK/

ΔVOS).

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