STM32F479AI datasheet(142/208 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32F479xx

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DocID028010 Rev 2

I2S interface characteristics

Unless otherwise specified, the parameters given in Table 65 for the I2S interface are

derived from tests performed under the ambient temperature, fPCLKx frequency and VDD

supply voltage conditions summarized in Table 17, with the following configuration:

•

Output speed is set to OSPEEDRy[1:0] = 10

•

Capacitive load C = 30 pF

•

Measurement points are done at CMOS levels: 0.5 VDD

Refer to Section 5.3.20 for more details on the input/output alternate function characteristics

(CK, SD, WS).

Note:

Refer to the I2S section of RM0386 reference manual for more details on the sampling

frequency (FS).

fMCK, fCK, and DCK values reflect only the digital peripheral behavior, source clock precision

might slightly change the values. The values of these parameters might be slightly impacted

by the source clock precision. DCK depends mainly on the value of ODD bit. The digital

Table 65. I2S dynamic characteristics(1)

Symbol

Parameter

Conditions

Min

Max

Unit

fMCK

I2S Main clock output

256x8K

256xFs(2)

MHz

fCK

I2S clock frequency

Master data

64xFs

Slave data

64xFs

DCK

I2S clock frequency duty cycle Slave receiver

tv(WS)

WS valid time

Master mode

th(WS)

WS hold time

Master mode

tsu(WS)

WS setup time

Slave mode

3.5

Slave mode

PCM short pulse mode(3)

3.5

th(WS)

WS hold time

Slave mode

0.5

Slave mode

PCM short pulse mode(3)

tsu(SD_MR)

Data input setup time

Master receiver

tsu(SD_SR)

Slave receiver

1.5

th(SD_MR)

Data input hold time

Master receiver

th(SD_SR)

Slave receiver

1.5

tv(SD_ST)

Data output valid time

Slave transmitter (after enable edge)

tv(SD_MT)

Master transmitter (after enable edge)

2.50

th(SD_ST)

Data output hold time

Slave transmitter (after enable edge)

th(SD_MT)

Master transmitter (after enable edge)

1. Guaranteed based on test during characterization.

2. 128xFs maximum is 24.756 MHz (APB1 Maximum frequency).

3. Measurement done with respect to I2S_CK rising edge.

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